Abstract.
A recent model for testing systems with multiple timers is extended to compute proper input delays and timeout settings, and is applied to several types of timers required in a testing procedure. In the model, any transition in the specification can be made conditional on a set of running timers. Depending on the path taken to reach an edge, the values of the timer variables may render the traversal of the edge infeasible. The presented modeling technique, combined with the INconsistencies DEtection and ELimination (INDEEL) algorithms, allows the generation of feasible test sequences. The model also offers the flexibility to define timer lengths as variables, and have the INDEEL find the appropriate timer ranges. An approach to apply this new methodology to SDL timed extensions (guarding and delaying timers) is presented.
M.A. Fecko initiated the timed EFSM model [9] at U Delaware. A.Y. Duale co-designed the INDEEL [6] at CUNY. They were then funded by the ATIRP Consortium sponsored by U.S. Army Research Lab (ARL) under the FedLab Program, Cooperative Agreement DAAL01-96-2-0002.
Chapter PDF
Similar content being viewed by others
References
Aho, A.V., Dahbura, A.T., Lee, D., Uyar, M.U.: An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours. IEEE Trans. Commun. 39(11), 1604–1615 (1991)
Alur, R., Dill, D.L.: A theory of timed automata. Elsevier J. Elsevier J. Theoret. Comput. Sci. 126, 183–235 (1994)
Bochmann, G.v., Petrenko, A.F., Bellal, O., Maguiraga, S.: Automating the process of test derivation from SDL specifications. In: Proc. SDL-Forum Symp., Evry, France, pp. 261–276 (1997)
Bozga, M., Graf, S., Mounier, L., Ober, I., Roux, J.-L., Vincent, D.: Timed extensions for SDL. In: SDL 2001 [17]
Budkowski, S., Dembiński, P.: An introduction to Estelle: A specification language for distributed systems. Elsevier J. Comput. Networks ISDN Syst. 14(1), 3–24 (1991)
Duale, A.Y., Uyar, M.U.: Generation of feasible test sequences for EFSM models. In: TestCom 2000 [21], pp. 91–109
Duale, A.Y., Uyar, M.U.: INDEEL: A software system for inconsistency detection and elimination. In: ATIRP 2001 [20], pp. 3.29–3.34 (2001)
En-Nouaary, A., Dssouli, R., Khendek, F.: Timed Wp-method: Testing real-time systems. IEEE Trans. Softw. Eng. 28(11), 1023–1038 (2002)
Fecko, M.A., Amer, P.D., Uyar, M.U., Duale, A.Y.: Test generation in the presence of conflicting timers. In: TestCom 2000 [21], pp. 301–320
Fecko, M.A., Uyar, M.U., Duale, A.Y., Amer, P.D.: A technique to generate feasible tests for communications systems with multiple timers. IEEE/ACM Trans. Network (to appear)
Fecko, M.A., Uyar, M.U., Duale, A.Y., Amer, P.D.: Efficient test generation for Army network protocols with conflicting timers. In: ATIRP 2001 [20], pp. 3.47–3.52 (2001)
Hogrefe, D., Koch, B., Neukirchen, H.: Some implications of MSC, SDL and TTCN time extensions for computer-aided test generation. In: SDL 2001 [17]
Khoumsi, A., En-Nouaary, A., Dssouli, R., Akalay, M.: A new method for testing real-time systems. In: Proc. IEEE RTCSA: Int’l Conf. Real-Time Comput. Syst. Appl., Cheju Island, S. Korea, pp. 441–450 (2000)
Lai, R.: A survey of communication protocol testing. Elsevier J. Syst. Softw. 62, 21–46 (2002)
Luo, G., Bochmann, G.v., Petrenko, A.F.: Test selection based on communicating nondeterministic finite state machines using a generalized Wp-method. IEEE Trans. Softw. Eng. 20(2), 149–162 (1994)
Petrenko, A.F., Bochmann, G.v.: On fault coverage of tests for finite state specifications. Elsevier J. Comput. Networks ISDN Syst. 29(1), 81–106 (1996)
Reed, R., Reed, J. (eds.): SDL 2001. LNCS, vol. 2078. Springer, Heidelberg (2001)
Rezaki, A., Ural, H.: Construction of checking sequences based on characterization sets. Elsevier J. Comput. Commun. 18(12), 911–920 (1995)
Springintveld, J., Vaandrager, F., D’Argenio, P.R.: Testing timed automata. Elsevier J. Theoret. Comput. Sci. 254(1-2), 225–257 (2001)
Tardif, A.J., Gowens, J.W. (eds.): ARL Advanced Telecommun./Information Distribution Research Program (ATIRP). UMD Printing (2001)
Ural, H., Probert, R.L., Bochmann, G.v. (eds.): Proc. IFIP TestCom: Int’l Conf. Test. Communicat. Syst., Ottawa, ON (2000)
Ural, H., Saleh, K., Williams, A.: Test generation based on control and data dependencies within system specifications in SDL. Elsevier J. Comput. Commun. 23(7), 609–627 (2000)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 IFIP International Federation for Information Processing
About this paper
Cite this paper
Fecko, M.A., Uyar, M.Ü., Duale, A.Y. (2003). Towards Testing SDL Specifications: Models and Fault Coverage for Concurrent Timers. In: König, H., Heiner, M., Wolisz, A. (eds) Formal Techniques for Networked and Distributed Systems - FORTE 2003. FORTE 2003. Lecture Notes in Computer Science, vol 2767. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39979-7_18
Download citation
DOI: https://doi.org/10.1007/978-3-540-39979-7_18
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-20175-5
Online ISBN: 978-3-540-39979-7
eBook Packages: Springer Book Archive