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Synchrotron X-Ray Microtomography

  • Conference paper
X-Ray Microscopy II

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

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Abstract

We present results obtained with a new form of 3-D microscopy. The technique is based on tomographic methods and we refer to it as 3-D Microtomography. When used with a tunable X-ray source, it is a powerful diagnostic and research tool for a wide variety of materials studies problems. It is capable of producing maps of the interior structure and chemical composition of samples approximately 0.5–1.0 mm in size, with spatial resolution in the map of the density variations approaching 1.0 micron.

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Author information

Authors and Affiliations

  1. Corporate Research Laboratories, Exxon Research and Engineering Co., Annandale, NJ, 08801, USA

    K. L. D’Amico, H. W. Deckman, B. P. Flannery & W. G. Roberge

Authors
  1. K. L. D’Amico
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  2. H. W. Deckman
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  3. B. P. Flannery
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  4. W. G. Roberge
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Editor information

Editors and Affiliations

  1. IBM T.J. Watson Research Center, 10598, Yorktown Heights, NY, USA

    David Sayre Ph. D.

  2. Department of Physics, State University of New York, 11794, Stony Brook, NY, USA

    Janos Kirz Ph. D.

  3. Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, 1 Cyclotron Rd., 94720, Berkeley, CA, USA

    Malcolm Howells Ph. D.

  4. National Synchrotron Light Source, Brookhaven National Laboratory, 11973, Upton, NY, USA

    Harvey Rarback Ph. D.

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© 1988 Springer-Verlag Berlin Heidelberg

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D’Amico, K.L., Deckman, H.W., Flannery, B.P., Roberge, W.G. (1988). Synchrotron X-Ray Microtomography. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_42

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_42

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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