Abstract
In X-ray contact microscopy, the image detector is usually a photoresist which is observed, after development, with an electron microscope. With this simple technique very high resolutions have been demonstrated, but quantitative measurements are very difficult to obtain [1,2]. Quantitative and real-time images can be produced on a high resolution image converter. In the fifties MOLLENSTEDT and HUANG realized such an apparatus which worked with a tungsten target X-ray tube [3]. A few years ago, we began the construction of a similar instrument to be used with soft X-ray radiation of the ACO storage ring [4].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
R. Feder, V. Mayne-Banton, D. Sayre, J. Costa, B.K. Kim, M.G. Baldini and P.C. Cheng: In X-ray Microscopy ed. by G. Schmahl and D. Rudolph, Springer Ser. Opt. Sci., Vol. 43 (Springer, Berlin, Heidelberg 1984 ) p. 279
P.C. Cheng, KH. Tan, J.W. Mc Gowan, R. Feder, H.B. Peng and B.M. Shinozaki: IN X -rav Microscopy ed. by G. Schmahl and D. Rudolph, Springer Ser. Opt. Sci., Vol. 43 (Springer, Berlin, Heidelberg 1984 ) p. 285
L.Y. Huang: Z. Phys. 149, 225 (1957)
F. Polack and S. Lowenthal: In X-ray Microscopy ed. by G. Schmahl and D. Rudolph, Springer Ser. Opt. Sci., Vol. 43 ( Springer, Berlin Heidelberg 1984 ) p. 251
B.L. Henke, J. Liesegang, S.D. Smith: Phys. Rev. B 19, 3004 ( 1979 Cheng. ESRF Workshop on X-ray microscopy
P.C. Dec. EMBL, Heidelberg, 1986, unpublished.
J.M. Kenney, C. Jacobsen, J. Kirz, H. Rarback, F. Cinotti, W. Thomlinson, R. Rosser and G. Schidlowski: J. Microsc. 138, 321 (1985)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1988 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Polack, F., Lowenthal, S., Phalippou, D., Fournet, P. (1988). First Images with the Soft X-Ray Image Converting Microscope at LURE. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_39
Download citation
DOI: https://doi.org/10.1007/978-3-540-39246-0_39
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-14490-9
Online ISBN: 978-3-540-39246-0
eBook Packages: Springer Book Archive