Abstract
The development of efficient optical elements for focusing and image transmission at soft X-ray wavelengths (0.5 nm – 10 nm) opens the way for realization of new methods in X-ray microscopy, local photoelectron analysis, plasma physics, astronomy, etc. In fact, only the last decade has witnessed the appearance of technological possibilities for fabricating high resolution X-ray diffractive elements thanks to advanced methods in microelectronics technology.
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Aristov, V.V., Erko, A.I., Panchencko, L.A., Martynov, V.V., Redkin, S.V., Sazonova, G.D. (1988). Zone Plates for the Nanometer Wavelength Range. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_23
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DOI: https://doi.org/10.1007/978-3-540-39246-0_23
Publisher Name: Springer, Berlin, Heidelberg
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