Abstract
As two-dimensional x-ray microscopy develops, it is of interest to consider also possible three-dimensional imaging methods, in view of the thick-specimen capability of soft x rays. The highest-quality 3-dimensional images of atomic assemblies today are produced by Fourier inversion of lA x-ray or neutron diffraction patterns of crystalline specimens. Here we consider whether a similar form of imaging may be obtained with noncrystalline specimens using soft x rays.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Reference
B.L. Henke et al.: “The Atomic Scattering Factor, fl + if2, for 94 Elements and for the 100 to 2000 eV Photon Energy Region”, in American Institute of Physics Conference Proceedings No. 75 (Low Energy X-Ray Diagnostics — 1981), eds. D.T. Attwood and B.L. Henke, pp. 340–388
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1984 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Sayre, D., Haelbich, R.P., Kirz, J., Yun, W.B. (1984). On the Possibility of Imaging Microstructures by Soft X-Ray Diffraction Pattern Analysis. In: Schmahl, G., Rudolph, D. (eds) X-Ray Microscopy. Springer Series in Optical Sciences, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38833-3_36
Download citation
DOI: https://doi.org/10.1007/978-3-540-38833-3_36
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-13547-1
Online ISBN: 978-3-540-38833-3
eBook Packages: Springer Book Archive