Abstract
Visual evoked potentials (VEPs) are gross electric signals generated in the occipital cortex in response to visual stimulation such as light or pattern. It is well known that the VEP is becoming a common clinical test for objective diagnosis of the function of the visual sense [1]. Recently versatile methods for the VEPs are commonly utilized, especially pattern VEPs which have been developed remarkably with the aid of microcomputer systems and commercial TV monitors [2]. However, these conventional pattern VEPs are strongly affected by refractive, accommodative, and fixation states of the subject’s eyes. Although these methods are applicable to the objective determination of refraction [3], it is necessary to correct fully these factors for the assessment of visual function. In infants and patients with refractive or accommodative anomalies which are extremely difficult to correct, the conventional pattern VEPs are of little clinical value.
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© 1983 Springer-Verlag Berlin Heidelberg
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Uozato, H., Fukuhara, J., Saishin, M., Nakao, S. (1983). Application of Laser Speckle Patterns to Visual Evoked Potentials. In: Breinin, G.M., Siegel, I.M. (eds) Advances in Diagnostic Visual Optics. Springer Series in Optical Sciences, vol 41. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38823-4_21
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DOI: https://doi.org/10.1007/978-3-540-38823-4_21
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