Linewidth Characteristics of (GaA1)As Semiconductor Diode Lasers

Mooradian, A.; Welford, D.; Fleming, M. W.

doi:10.1007/978-3-540-38804-3_9

A. Mooradian⁵,
D. Welford⁵ &
M. W. Fleming⁵^nAff6

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 30))

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Abstract

Use of semiconductor diode lasers as high resolution spectral sources requires an understanding of the linewidth characteristics of these devices. Reported here is a study of the power and temperature dependence of the fundamental linewidth of continuously operating (GaAl)As single mode diode lasers. The linewidths were observed to decrease linearly with reciprocal output power with a slope significantly greater than the calculated Schawlow-Townes linewidth at room temperature. At liquid nitrogen temperature, within experimental error, the slope decreased to the Schawlow-Townes limit and had a finite contribution which is attributed to index fluctuations arising from electron density fluctuations in the small gain volume of these devices.

This work was sponsored by the Department of the Air Force.

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References

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Author information

M. W. Fleming
Present address: Central Research Laboratories, 3M Center, St. Paul, Minnesota, 55144, USA

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Lincoln Laboratory, Massachusetts Institute of Technology, Box 73, Lexington, MA, 02173, USA
A. Mooradian, D. Welford & M. W. Fleming

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A. Mooradian
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D. Welford
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M. W. Fleming
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Editors and Affiliations

Herzberg Institute of Astrophysics, National Research Council of Canada, K1A OR6, Ottawa, Ontario, Canada
A. Robert W. McKellar
Department of Chemistry, of Astronomy, and Astrophysics, University of Chicago, 60637, Chicago, IL, USA
Takeshi Oka
Department of Physics, McLennan Physics Laboratory, University of Toronto, M5S 1A7, Toronto, Ontario, Canada
Boris P. Stoicheff

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Mooradian, A., Welford, D., Fleming, M.W. (1981). Linewidth Characteristics of (GaA1)As Semiconductor Diode Lasers. In: McKellar, A.R.W., Oka, T., Stoicheff, B.P. (eds) Laser Spectroscopy V. Springer Series in Optical Sciences, vol 30. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38804-3_9

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DOI: https://doi.org/10.1007/978-3-540-38804-3_9
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-15380-2
Online ISBN: 978-3-540-38804-3
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