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Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives

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Applied Scanning Probe Methods VII

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Author information

Authors and Affiliations

  1. Quality of Life Division, National Physcial Laboratory (NPL), Hampton road, Teddington, Middlesex, TW11 0LW, UK

    Martin Munz

  2. Federal Institute for Materials Research (BAM), VI.25, Unter den Eichen 87, D-12205, Berlin, Germany

    Heinz Sturm

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  1. Martin Munz
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Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, 201W. 19th Avenue, Columbus, Ohio, 43210-1142, USA

    Bharat Bhushan

  2. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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Munz, M., Sturm, H. (2007). Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods VII. NanoScience and Technology. Springer, Berlin, Heidelberg . https://doi.org/10.1007/978-3-540-37321-6_8

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