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Transmission Electron Microscopy: Fundamentals of Methods and Instrumentation

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Electron Microscopy of Polymers

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Abstract

In this chapter, after a brief history of transmission electron microscopy, the fundamentals of electron optics and instrumentation are described. Following the path of the electron beam, themicroscope can be split into the following parts: electron gun, illumination system, objective lens and specimen stage, image-forming system and viewing chamber/image recording. These units are described in detail before the fundamentals of image formation are discussed. The differences between the scattering mechanisms that occur in amorphous and crystalline materials lead to an explanation of image contrast. However, the intensity distribution of the image depends not only on the interaction of the electron beam with the object, but also on the illumination conditions and in particular the action of the objective lens and arranged apertures.This electron-optical imaging process, including microscope aberrations, is described in detail based on the wave-mechanical theory of contrast formation.

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© 2008 Springer-Verlag Berlin Heidelberg

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(2008). Transmission Electron Microscopy: Fundamentals of Methods and Instrumentation. In: Electron Microscopy of Polymers. Springer Laboratory. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-36352-1_3

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