Abstract
The measurement of the state of polarization of a light beam is of particular importance for the problem of the photoelastic determination of the stresses induced in a two- or three-dimensional body. In these problems, the state of stress of the body in question modifies the polarization form of the incident light beam, so that the emerging light contains enough information for determination of the stresses of the body. The complete characterization of the state of polarization of the output light constitutes the main part of the problem.
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References
C. V. Kent, J. Lawson: J. Opt. Soc. Am. 27, 117 (1937)
J. F. Archard, P. L. Clegg, A. M. Taylor: Proc. Phys. Soc. London B65, 758 (1952)
A. Robert, E. Guillemet: Rev. Fr. Méc. Nos 5–6, 147 (1963)
A. Robert, J. L. Vernet: Conf. au troisième Congrès international d’analyse des contraintes (Berlin 1966)
A. Robert, C. Bourdon, J. L. Le Goer: Rev. Fr. Méc. No 24, 93 (1967)
A. Robert: Bull. Soc. Fr. Minéral. Cristallogr. 91, 415 (1968).
A. Robert, M. Ferre: Bull. ATMA 69, 1 (1969)
A. J. Robert: Exp. Mech. 7, 224 (1967)
A. Robert: Int. J. Solids Struct. 6, 423 (1970)
A. Robert: Polarimétrie et Photoélasticimétrie (Serv. Techn. Const. Armes Navales, Paris 1972)
Z. Sekera: Adv. Geophys. 3, 43 (1956)
W. Budde: Appl. Opt. 1, 201 (1962)
B. A. Ioshpa, V. N. Obridko: Opt. Spectrosc. USSR 15, 60 (1963)
H. Takasaki, N. Okazaki, K. Kida: Appl. Opt. 3, 833 (1964)
H. Takasaki, M. Isobe, T. Masaki, A. Konda, T. Agatsuma, Y. Watanabe: Appl. Opt. 3, 345 (1964)
M. Richartz, H. Y. Hsii: J. Opt. Soc. Am. 39, 136 (1949)
J. H. Jellett: Rpt. Br. Assoc. 30, 13 (1860)
M. A. Cornu: Bull. Soc. Chim. 14, 140 (1870)
O. Schönrock: „Polarimetrie“, in Elektrische Leistungsphänomene I, Handbuch der Physik, Hrsg. H. Geiger, K. Scheel, Bd. 19 (Springer, Berlin 1928) pp. 705–776
F. Lippich: Wien. Ber. 91, 1059 (1885)
S. Nakamura: Zentralblatt f. Min. Vol. 267 (1905)
E. Bertrand: Bull. Soc. Mineral. 1, 22 (1878)
J. Strong: Rev. Sci. Instr. 6, 243 (1935)
M. Chauvin: Ann. de Toulouse 3, 30 (1889)
M. L. Chaumont: Ann. Phys. (Paris) 4, 175 (1915)
G. G. Stokes: Math. Phys. Pap. Cambridge 3, 197 (1901)
J. MacCullagh: Collected Works, Dublin, London (1880) pp. 138, 230
A. Q. Tool: Phys. Rev. 31, 1 (1910)
C. A. Skinner: J. Opt. Soc. Am. 10, 491 (1925)
G. Szivessy: Z. Instrumentenkd. 47, 148 (1927)
C. Bergholm, Y. Björnstahl: Physik. Zeitschr. 21, 137 (1920)
M. Richartz: Z. Instrumentenkd. 60, 357 (1940)
G. Szivessy: In Kristalloptik, Handbuch der Physik, Hrsg. H. Geiger, K. Scheel, Bd. 20 (Springer, Berlin 1928) pp. 635–904
H. G. Jerrard: J. Opt. Soc. Am. 38, 35 (1948)
H. G. Jerrard: J. Sci. Instrum. 28, 10 (1951)
H. G. Jerrard: J. Sci. Instrum. 26, 353 (1949)
H. G. Jerrard: J. Sci. Instrum. 27, 62 (1950)
H. G. Jerrard: J. Sci. Instrum. 27, 164 (1950)
H. G. Jerrard: J. Sci. Instrum. 30, 65 (1953)
M. Françon, B. Sergent: Opt. Acta 2, 182 (1955)
Books
Clarke, D., Grainger, J.F.: Polarized Light and Optical Measurement (Pergamon Press, Oxford 1971) Chap.4, pp.118–154
MacCullagh, J.: Collected Works, pp.138, 230 (Dublin, London 1880)
Ramachandran, G.N., Ramaseshan, S.: “Crystal Optics”, in Crystal Optics, Diffraction, ed. by S. Flügge, Ency clopedia of Physics, Vol. 25/1 (Springer, Berlin, Göttingen, Heidelberg 1961) pp.34–53
Schönrock, O.: “Polarimetrie”, in Elektrische Leistungsphänomene I, Handbuch der Physik, Hrsg. H. Geiger, K. Scheel, Bd. 19 (Springer, Berlin 1928) pp.705–776
Papers
Archard, J.F., Clegg, P.L., Taylor, A.M.: Photoelectric analysis of elliptically polarized light. Proc. Phys. Soc. London B 65, 758–768 (1952)
Azzam, R.M.A.: Alternate arrangement and analysis of systematic errors for dynamic photometric ellipsometers employing an oscillating-phase retarder. Optik 45, 209–218 (1976)
Bergholm, C., Björnstahl, Y.: Elektrische Doppelbrechung in Kolloiden. Physik. Zeitschr. 21, 137–141 (1920)
Bertrand, E.: De l’application du microscope à l’étude de la minéralogie. Bull. Soc. Mineral, 1, 22–28 (1878)
Budde, W.: Photoelectric analysis of polarized light. Appl. Opt. 1, 201–205 (1962)
Chaumont, M.L.: Recherches expérimentales sur le phénomène électrooptique de Kerr et sur les méthodes servant à l’étude de la lumière polarisée elliptiquement. Ann. de Phys. Paris 4, 175–206 (1915)
Chauvin, M.: Polarisation rotatoire magnétique dans le spath d’Islande. Ann. de Toulouse 3, 30–49 (1889)
Cheng, J.C.: Polarization scrambling using a photoelastic modulator: Application to linear dichroism measurement. Rev. Sci. Instrum. 48, 1086–1089 (1977)
Cornu, M.A.: Appareil destiné aux mesures des pouvoirs rotatoires. Bull. Soc. Chim. 14, 140–142 (1870)
Ferre, M.: Description et élaboration d’un ellipsomètre dynamique. Application à la photoélasticimétrie dynamique. Ecole Nationale Superieure de Techniques Avancées, Rpt. 073, Paris (1976) pp. 84
Françon, M., Sergent, B.: Compensateur biréfringent à grand champ. Opt. Acta 2, 182–184 (1955)
Holoubek, J.: The use of mueller matrices in the intensity methods of birefringence measurements. Czech. J. Phys. B 24, 1162–1167 (1974)
Hyde, W.L., Tubbs, E.F., Koester, C.J.: An automatic photoelectric Polarimeter. J. Opt. Soc. Am. 49, 513 (1959)
Ioshpa, B.A., Obridko, V.N.: Photoelectric analysis of polarized light. Opt. Spectrosc. USSR 15, 60–62 (1963)
Jellett, J.H.: On a new instrument for determining the plane of polarization. Rpt. Br. Assoc. 30, 13 (1860)
Jerrard, H.G.: Optical compensators for measurement of elliptical polarization. J. Opt. Soc. Am. 38, 35–59 (1948)
Jerrard, H.G.: Accurate adjustment of the wedges of a Babinet compensator. J. Sci. Instrum. 26, 353–357 (1949)
Jerrard, H.G.: Examination and calibration of a Babinet compensator. J. Sci. Instrum. 27, 62–66 (1950)
Jerrard, H.G.: Accurate adjustment of the wedges of a Soleil compensator. J. Sci. Instrum. 27, 164–167 (1950)
Jerrard, H.G.: Use of a half-shadow plate with uniform field compensators. J. Sci. Instrum. 28, 10–14 (1951).
Jerrard, H.G.: The examination and calibration of Soleil compensators. J. Sci. Instrum. 30, 65–70 (1953)
Kent, C.V., Lawson, J.: A photoelectric method for the determination of the parameters of elliptically polarized light. J. Opt. Soc. Am. 27, 117–119 (1937)
Lagarde, A., Oheix, P.: “Méthodes ponctuelles statiques et dynamiques de photoélasticimétrie pour des problèmes bidimensionnels”; Proc. 5th Int. Conf. Exp. Stress Analysis, Udine, 1974, ed. by G. Bartolozzi (Tecnoprint-Pitagora, Bologna 1974) pp.1.21–1.28
Lagarde, A., Oheix, P.: “Static and Dynamic Ponctuai Method for the Determination of the Neutral Axis and the Algebraic Value of the Birefringence for a Plane Plate”, in Photoelastic Effect and Its Applications (IUTAM Symposium) ed. by J. Kestens (Springer, Berlin, Heidelberg, New York 1975) pp.525–531
Lippich, F.: über polaristrobometrische Methoden, insbesondere über Halbschattenapparate. Wien. Ber. 91, 1059–1096 (1885)
Lipskii, Y.N., Pospergelis, M.M.: Some results of measurements of the total Stokes vector for details of the lunar surface. Sov. Astron.-AJ 11, 324–326 (1967)
Nakamura, S.: Neue Instrumente und Beobachtungsmethoden. Zentralblatt f. Min. 267–279 (1905)
Oheix, P., Lagarde, A.: Sur une conception des mesures en photoélasticimétrie bidimensionelle. Rev. Fr. de Méc. 63–70 (1973)
Oheix, P.: Méthode globale de détermination de l’ordre de frange en valeur algébrique d’un modèle photoélastique bidimensional et visualisation des franges de quart d’onde. C.R. Acad. Sci. B 279, 361–363 (1974)
Pospergelis, M.M.: The “Taimyr” electronic Polarimeter. Sov. Astron.-AJ 9, 313–321 (1965)
Pospergelis, M.M.: Measurement and computation of the instrumental Stokes vector. Sov. Astron.-AJ 12, 512–521 (1968)
Pospergelis, M.M.: Spectroscopic measurements of the four Stokes parameters for light scattered by natural objects. Sov. Phys.-Astron. 12, 973–977 (1969)
Richartz, M.: Einfache Halbschattenvorrichtung für den Viertelwellenlängen-kompensator. Z. Instrumentenkd. 60, 357–360 (1940)
Richartz, M., Hsü, H.Y.: Analysis of elliptical polarization. J. Opt. Soc. Am. 39, 136–157 (1949)
Robert, A.: “New Methods in Three-Dimensional Photoelasticity”, Proc. 2nd SESA Int. Congress on Exp. Mech., Washington, D.C. Sept. 1965, ed. by B.E. Rossi (1966) pp.123–131
Robert, A.J.: New methods in photoelasticity. Exp. Mech. 7, 224–232 (1967)
Robert, A.: Application de la sphère de Poincaré à l’ellipsométrie de précision. Bull. Soc. Fr. Minéral. Cristallogr. 91, 415–421 (1968)
Robert, A.: The application of Poincaré’s sphère to photoelasticity. Int. J. Solids Struct. 6, 423–432 (1970)
Robert, A.: La sphère de Poincaré et ses applications à la mesure des formes de lumière et à la photoélasticimétrie classique. Sci. et techniques de l’Armement 45, 309–379 (1971)
Robert, A.: “Polarimétrie et photoélasticimétrie”. Serv. Techn. Const. Armes Navales, Paris (1972)
Robert, A., Bourdon, C., Le Goer, J.L.: Principe et description d’un photo-élasticimètre tridimensionel á lumière diffusée. Rev. Fr. Méc. 24, 93–116 (1967)
Robert, A., Dore, A.: “Méthode de photoélasticimétrie dynamique”, Proc. 5th Int. Conf. Exp. Stress Analysis, Udine, 1974, ed. by G. Bartolozzi (Tecnoprint-Pitagora, Bologna 1974) pp.1.38–1.42
Robert, A., Ferre, M.: Principe et description d’un photoélasticimètre automatique application à l’étude d’une tranche de pétrolier. Bull. Association Technique Maritime et Aéronautique 69, Memoire No. 1549, 1–15 (1969)
Robert, A., Guillemet, E.: Nouvelle méthode d’utilisation de la lumière diffusée en photoélasticimétrie à trois dimensions. II. Mise au point pratique. Rev. Fr. Méc. 5–6, 147–157; 7–8, 39–46 (1963)
Seielstad, G.A., Berge, G.L.: Time dependence of the integrated Stokes parameters of compact radio sources at 5 GHz. Astron. J. 80, 271–281 (1975)
Sekera, Z.: Recent developments in the study of the polarization of sky light. Adv. Geophys. 3, 43–104 (1956)
Skinner, C.A.: A universal Polarimeter. J. Opt. Soc. Am. 10, 491–520 (1925)
Som, S.C., Chowdhury, C.: New ellipsometric method for the determination of the optical constants of thin films and surfaces. J. Opt. Soc. Am. 62, 10–15 (1972)
Stokes, G.G.: On a new elliptic analyser. Math. and Phys. Papers, Cambridge, 3, 197–202 (1901)
Szivessy, G.: Ober den Gebrauch des Braceschen Halbschattenkompensators bei der gleichzeitigen Messung von Azimut und Elliptizität der Schwingungsellipse. Z. Instrumentenkd. 47, 148–154 (1927)
Takasaki, H., Isobe, M., Masaki, T., Konda, A., Agatsuma, T., Watanabe, Y.: An automatic retardation meter for automatic polarimetry by means of an ADP polarization modulator. Appl. Opt. 3, 345–350 (1964)
Takasaki, H., Okazaki, N., Kida, K.: An automatic Polarimeter, Pt. II. Automatic polarimetry by means of an ADP polarization modulator. Appl. Opt. 3, 833–837 (1964)
Tardy, M.H.L.: Méthode pratique d’éxamen et de mesure de la biréfringence des verres d’optique. Rev. Opt. 8, 59–69 (1929)
Tool, A.Q.: A method for measuring ellipticity and the determination of optical constants of metals. Phys. Rev. 31, 1–25 (1910)
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Theocaris, P.S., Gdoutos, E.E. (1979). Measurement of Elliptically Polarized Light. In: Matrix Theory of Photoelasticity. Springer Series in Optical Sciences, vol 11. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-35789-6_5
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