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Inelastic X-Ray Scattering from Phonons

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Light Scattering in Solid IX

Part of the book series: Topics in Applied Physics ((TAP,volume 108))

Abstract

This Chapter presents the current status of phonon-dispersion studies using very high energy resolution inelastic X-ray scattering. The theoretical background and the instrumental principles are briefly summarized. This is followed by a representative selection of studies on single crystals and polycrystalline materials, including high-pressure work. The Chapter concludes with novel applications of the technique.

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  1. European Synchrotron Radiation Facility, B.P. 220, 38043, Grenoble Cédex, France

    Michael Krisch & Francesco Sette

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  1. Michael Krisch
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Manuel Cardona Roberto Merlin

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Krisch, M., Sette, F. (2006). Inelastic X-Ray Scattering from Phonons. In: Cardona, M., Merlin, R. (eds) Light Scattering in Solid IX. Topics in Applied Physics, vol 108. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-34436-0_5

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-34435-3

  • Online ISBN: 978-3-540-34436-0

  • eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)

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