Abstract
TTCN-3 (Testing and Test Control Notation 3) [1,2,3] test suites developed for testing complicated systems contain a large number of test data definitions. These definitions are often redundant and lengthy, which leads to compilation and run-time inefficiencies. Our intention is to provide remedy for this problem, by proposing a method that restructures the test data definitions of an already existing TTCN-3 module. In this paper we introduce a model for TTCN-3 test data and a method for its optimization. The results of an empirical study using our approach is presented as well.
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© 2005 IFIP International Federation for Information Processing
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Wu-Hen-Chang, A., Le Viet, D.u., Batori, G., Gecse, R., Csopaki, G. (2005). High-Level Restructuring of TTCN-3 Test Data. In: Grabowski, J., Nielsen, B. (eds) Formal Approaches to Software Testing. FATES 2004. Lecture Notes in Computer Science, vol 3395. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-31848-4_13
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DOI: https://doi.org/10.1007/978-3-540-31848-4_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-25109-5
Online ISBN: 978-3-540-31848-4
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