Abstract
An embedded system is a combination of hardware and software subsystems. Interaction between these two subsystems may lead to unexpected behavior when faults are present in either. An effective technique is required to detect the presence of such ”interaction faults” in an embedded system. We propose a test data selection technique for interaction testing in the embedded system using hardware fault injection and mutation test criteria. The proposed technique simulates hardware faults as software faults and uses these to mutate the software component. The mutants so created are then used as a means to select test data that differentiates the original program from the mutants. An experimental evaluation of the proposed technique is also presented.
This work was partially supported by grant No.R04-2003-000-10139-0 from the Basic Research Program of the Korea Science & Engineering Foundation. This work was partially supported by the Ministry of Science and Technology under the KNICS Projects. This work was partially supported by University IT Research Center Project.
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Sung, A., Choi, B. (2004). Interaction Testing in an Embedded System Using Hardware Fault Injection and Program Mutation. In: Petrenko, A., Ulrich, A. (eds) Formal Approaches to Software Testing. FATES 2003. Lecture Notes in Computer Science, vol 2931. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-24617-6_14
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DOI: https://doi.org/10.1007/978-3-540-24617-6_14
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