Advertisement

Automatic Generation of Test Purposes for Testing Distributed Systems

  • Olaf Henniger
  • Miao Lu
  • Hasan Ural
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2931)

Abstract

In this paper, we present an algorithm for generating test purpose descriptions in form of MSC’s from a given labeled event structure that represents the behavior of a system of asynchronously communicating extended finite state machines. The labeled event structure is a non-interleaving behavior model de- scribing the behavior of a system in terms of the partial ordering of events.

Keywords

State Machine Test Purpose Implementation Under Test Event Queue Message Sequence Chart 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Specification and Description Language (SDL-2000). ITU-T Recommendation Z.100 (1999)Google Scholar
  2. 2.
    Information technology – Open Systems Interconnection – Conformance testing methodology and framework – Part 1: General concepts, International Standard ISO/IEC 9646-1, 2nd edn. (1994)Google Scholar
  3. 3.
    Message Sequence Chart (MSC). ITU-T Recommendation Z.120 (1999)Google Scholar
  4. 4.
    Koch, B., Grabowski, J., Hogrefe, D., Schmitt, M.: Autolink – a tool for automatic test generation from SDL specifications. In: Proc. of the 2nd IEEE Workshop on Industrial Strength Formal Specification Techniques, Boca Raton, Florida, USA (1998)Google Scholar
  5. 5.
    Kerbrat, T., Jéron, Groz, R.: Automated test generation from SDL specifications. In [17], pp. 135–151 Google Scholar
  6. 6.
    Henniger, O.: Test generation from specifications in Estelle and SDL., Ph.D. thesis (in German), Brandenburg Technical University of Cottbus, Germany, Shaker Verlag (2002)Google Scholar
  7. 7.
    Grabowski, J., Koch, B., Schmitt, M., Hogrefe, D.: SDL and MSC based test generation for distributed test architectures. In [17], pp. 389–404Google Scholar
  8. 8.
    Jard, C.: Synthesis of distributed testers from true-concurrency models of reactive systems. Information and Software Technology 45, 805–814 (2003)CrossRefGoogle Scholar
  9. 9.
    Henniger, O., Ulrich, A., König, H.: Transformation of Estelle modules aiming at test case generation. In: Cavalli, A., Budkowski, S. (eds.) Proc. of IWPTS 1995, Evry, France, pp. 36–51 (1995)Google Scholar
  10. 10.
    Nielsen, M., Plotkin, G., Winskel, G.: Petri nets, event structures and domains, Part I. Theoretical Computer Science 13, 85–108 (1981)zbMATHCrossRefMathSciNetGoogle Scholar
  11. 11.
    Itoh, M., Ichikawa, H.: Protocol verification algorithm using reduced reachability analysis. Transactions of the IECE of Japan E 66(2), 88–93 (1983)Google Scholar
  12. 12.
    Arakawa, N., Soneoka, T.: A test case generation method for concurrent programs. In: Kroon, J., Heijink, R.J., Brinksma, E. (eds.) Proc. of IWPTS 1991, Leidschendam, The Netherlands, pp. 95–106 (1991)Google Scholar
  13. 13.
    McMillan, K.L.: A technique of state space search based on unfolding. Formal Methods in System Design 6(1) (1995)Google Scholar
  14. 14.
    Esparza, J., Römer, S., Vogler, W.: An improvement of McMillan’s unfolding algorithm. Formal Methods in System Design 20(3), 285–310 (2002)zbMATHCrossRefGoogle Scholar
  15. 15.
    Lu, M.: Generation of tests from labeled event structures, M.Sc. thesis, University of Ottawa, Canada (May 2003)Google Scholar
  16. 16.
    Methods for Testing and Specification; The Testing and Test Control Notation Version 3; Part 3: TTCN-3 Graphical Presentation Format (GFT), ETSI Standard ETSI ES 201 873-3 (February 2003)Google Scholar
  17. 17.
    Dssouli, R., Bochmann, G.v., Lahav, Y. (eds.): Proc. of the 9th SDL Forum, Montréal, Québec, Canada (1999)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2004

Authors and Affiliations

  • Olaf Henniger
    • 1
  • Miao Lu
    • 2
  • Hasan Ural
    • 2
  1. 1.Fraunhofer Institute Secure TelecooperationDarmstadtGermany
  2. 2.School of Information Technology and EngineeringUniversity of OttawaOttawaCanada

Personalised recommendations