Summary
This paper describes the use of evanescent light for the optical characterization of polymer thin films and interfaces. Firstly, a few basic concepts of evanescent wave phenomena, including total internal reflection, plasmon surface polaritons and guided optical modes, are reviewed. It is shown that the excitation of these waves allows for a sensitive determination of the optical architecture of the interface(s) involved. This “surface light” can then be used for the same broad range of optical techniques as it is known from experimental set-ups designed for the investigation of various optical properties of polymer samples using plane electromagnetic waves, i.e. “normal” photons. This is demonstrated for diffraction experiments and microscopic investigations. The examples given include thin polymer films prepared by spin-coating or by the Langmuir-Blodgett-Kuhn technique.
This contribution is part of a review published in Makromol. Chem. 192 (1991) 2827
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© 1993 B. G. Teubner Verlagsgesellschaft Leipzig
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Knoll, W., Hickel, W., Sawodny, M. (1993). Optical Characterization of Ultrathin Polymer Films by Evanescent Light. In: Ehrfeld, W., Wegner, G., Karthe, W., Bauer, HD., Moser, H.O. (eds) Integrated Optics and Micro-Optics with Polymers. TEUBNER-TEXTE zur Physik. Vieweg+Teubner Verlag, Wiesbaden. https://doi.org/10.1007/978-3-322-93430-7_7
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DOI: https://doi.org/10.1007/978-3-322-93430-7_7
Publisher Name: Vieweg+Teubner Verlag, Wiesbaden
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