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Abstands- und Winkelmetriken in Cayley/Klein-Räumen

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Vorlesungen über höhere Geometrie
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Zusammenfassung

Die Geraden eines CK-Raumes lassen sich im komplex erweiterten projektiven Raum Pn klassifizieren nach ihrer Lage zu seiner Absolutfigur F:

$$\text Q_{\text r_o\; \text q_o}^{\text n-1}\supset \text A^{\text n_1} \supset \text Q_{\text r_1 \; \text q_1}^{\text n_1-1} \supset \dots \supset \text A^{\text n_\nu} \supset \text Q_{\text r_\nu \text q_\nu}^{\text n_\nu-1} \supset \text A^{\text n_{\nu+1}} \supset \dots \supset \text A^{\text n_\rho} \supset \text Q_{\text r_\rho \text q_\rho}^{\text n_\rho-1}\;\;.$$

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© 1982 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH, Braunschweig

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Giering, O. (1982). Abstands- und Winkelmetriken in Cayley/Klein-Räumen. In: Vorlesungen über höhere Geometrie. Vieweg+Teubner Verlag. https://doi.org/10.1007/978-3-322-83552-9_8

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  • DOI: https://doi.org/10.1007/978-3-322-83552-9_8

  • Publisher Name: Vieweg+Teubner Verlag

  • Print ISBN: 978-3-528-08492-9

  • Online ISBN: 978-3-322-83552-9

  • eBook Packages: Springer Book Archive

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