Summary and Outlook

Abstract

In this book, the technique of lock-in thermography is being reviewed with special emphasis on its application to the characterization and functional testing of electronic components. The investigation of shunting phenomena in solar cells, which our lock-in thermography originally was developed for, among a lot of other applications is presented to demonstrate and discuss all the different possibilities of this rather new technique. We hope to have shown that the use of lock-in thermography instead of conventional (steady-state) thermography is a qualitatively new thermographic approach to electronic device testing and failure analysis.