Abstract
Some applications of Lock-in Thermography for the investigation of a thermally thin sample (solar cell) and a thermally thick one (IC) were already presented in the examples given in Chap. 5. In the following section we will present some more applications, showing the universal applicability of this technique to different fields of functional diagnostics of electronic components.
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Breitenstein, O., Warta, W., Schubert, M.C. (2018). Typical Applications. In: Lock-in Thermography. Springer Series in Advanced Microelectronics, vol 10. Springer, Cham. https://doi.org/10.1007/978-3-319-99825-1_6
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DOI: https://doi.org/10.1007/978-3-319-99825-1_6
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Publisher Name: Springer, Cham
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Online ISBN: 978-3-319-99825-1
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