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Active Evidential Calibration of Binary SVM Classifiers

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Belief Functions: Theory and Applications (BELIEF 2018)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 11069))

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Abstract

Evidential calibration methods of binary classifiers improve upon probabilistic calibration methods by representing explicitly the calibration uncertainty due to the amount of training (labelled) data. This justified yet undesirable uncertainty can be reduced by adding training data, which are in general costly. Hence the need for strategies that, given a pool of unlabelled data, will point to interesting data to be labelled, i.e., to data inducing a drop in uncertainty greater than a random selection. Two such strategies are considered in this paper and applied to an ensemble of binary SVM classifiers on some classical binary classification datasets. Experimental results show the interest of the approach.

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Notes

  1. 1.

    \(Bel^\varTheta _x\) must be induced by a source [7]. It may be obtained by a number of evidential methods to statistical inference, and in particular the likelihood-based evidential method [8] in which case \(Bel^\varTheta _x\) is the consonant belief function whose contour function is the normalized likelihood function given the observed data x.

  2. 2.

    Equation (2) corresponds to a degenerate binning approach with only two bins. It can be derived rigorously without referring to the evidential binning calibration, by following a similar reasoning to the one used in [3] to obtain this latter calibration.

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Acknowledgements

This work is funded in part by the ELSAT2020 project, which is co-financed by the European Union with the European Regional Development Fund, the French state and the Hauts de France Region Council.

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Correspondence to Sébastien Ramel .

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Ramel, S., Pichon, F., Delmotte, F. (2018). Active Evidential Calibration of Binary SVM Classifiers. In: Destercke, S., Denoeux, T., Cuzzolin, F., Martin, A. (eds) Belief Functions: Theory and Applications. BELIEF 2018. Lecture Notes in Computer Science(), vol 11069. Springer, Cham. https://doi.org/10.1007/978-3-319-99383-6_26

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  • DOI: https://doi.org/10.1007/978-3-319-99383-6_26

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