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Hybrid Signal Selection

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Post-Silicon Validation and Debug

Abstract

A popular metric for evaluation of the quality of trace signal selection and degree of improvement in observability is the State Restoration Ratio (SRR). How SRR is approximated during trace signal selection directly impacts the complexity to explore the design space. Majority of the existing algorithms explore the design space by either relying on an accurate but time-consuming simulation process to evaluate SRR, or develop metrics to approximate the SRR quickly but with less accuracy. This chapter discusses a medium ground which utilizes both approaches within a hybrid framework, which is able to explore the design space for signal selection significantly faster than the simulation-based algorithms and also achieve significantly higher accuracy than the metric-based ones.

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References

  1. M. Abramovici, P. Bradley, K.N. Dwarakanath, P. Levin, G. Memmi, D. Miller, A reconfigurable design-for-debug infrastructure for SoCs, in Design Automation Conference (2006), pp. 7–12

    Google Scholar 

  2. H.F. Ko, N. Nicolici, Algorithms for state restoration and trace-signal selection for data acquisition in silicon debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2), 285–297 (2009)

    Google Scholar 

  3. X. Liu, Q. Xu, On signal selection for visibility enhancement in trace-based post-silicon validation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(8), 1263–1274 (2012)

    Google Scholar 

  4. H. Shojaei, A. Davoodi, Trace signal selection to enhance timing and logic visibility in post-silicon validation, in International Conference on Computer-Aided Design (2010), pp. 168–172

    Google Scholar 

  5. E. Hung, S.J.E. Wilton, Scalable signal selection for post-silicon debug. IEEE Trans. Very Large Scale Integr. VLSI Syst. 21(6), 1103–1115 (2012)

    Google Scholar 

  6. K. Basu, P. Mishra, RATS: restoration-aware trace signal selection for post-silicon validation. IEEE Trans. VLSI Syst. 21(4), 605–613 (2013)

    Google Scholar 

  7. D. Chatterjee, C. McCarter, V. Bertacco, Simulation-based signal selection for state restoration in silicon debug, in International Conference on Computer-Aided Design (2011), pp. 595–601

    Google Scholar 

  8. K. Zhao, J. Bian, Pruning-based trace signal selection algorithm for data acquisition in post-silicon validation. Inst. Electron. Inf. Commun. Eng. Trans. 95(A(6)), 1030–1040 (2012)

    Google Scholar 

  9. J.-S. Yang, N.A. Touba, Efficient trace signal selection for silicon debug by error transmission analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(3), 442–446 (2012)

    Google Scholar 

  10. Y.-S. Yang, A.G. Veneris, N. Nicolici, Automating data analysis and acquisition setup in a silicon debug environment. IEEE Trans. Very Large Scale Integr. VLSI Syst. 20(6), 1118–1131 (2012)

    Google Scholar 

  11. M. Li, A. Davoodi, A hybrid approach for fast and accurate trace signal selection for post-silicon debug, in Design, Automation, and Test in Europe (2013), pp. 485–490

    Google Scholar 

  12. M. Li, A. Davoodi, A hybrid approach for fast and accurate trace signal selection for post-silicon debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(7), 1081–1094 (2014)

    Google Scholar 

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Correspondence to Azadeh Davoodi .

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Davoodi, A. (2019). Hybrid Signal Selection. In: Mishra, P., Farahmandi, F. (eds) Post-Silicon Validation and Debug. Springer, Cham. https://doi.org/10.1007/978-3-319-98116-1_5

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  • DOI: https://doi.org/10.1007/978-3-319-98116-1_5

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-98115-4

  • Online ISBN: 978-3-319-98116-1

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