Abstract
In this chapter, DC, RF and noise behaviour of AlGaN/GaN HEMT with 1 µm gate length are studied performing computer simulations using Silvaco TCAD software. The device exhibits a maximum drain current of 645 mA/mm and maximum transconductance of the 162 mS/mm at the gate voltage of 0 and 2.5 V, respectively. The cut-off frequency (fT) and maximum oscillation frequency of about 9.74 and 32.24 GHz are estimated from the simulated results. In addition, device exhibits a minimum noise figure of 10 dB at maximum frequency of 10 GHz. The simulated results are in good agreement with experimental results suggesting AlGaN/GaN HEMT an optimal choice for high voltage and high power applications.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
J.P. Ibbetson, Y. Zhang, I.P. Smorchkova, C.R. Elsass, S. Keller, S. DenBaars, U.K. Mishra, J. Singh, Polarization effects surface states, and the source of electrons in AlGaN/GaN hetrostructure field effect transistors. Appl. Phys. Lett. 77(2), 250–252 (2000)
Y. Yue, Z. Hu, J. Guo, G. Li, D. Jena, InAlN/AlN/GaN HEMTs with regrown ohmic contacts and fT of 370 GHz. IEEE Electron Device Lett. 33(7), 988–990 (2012)
N.K. Subramani, A.K. Sahoo, J. Nallatamby, R. Sommet, R. Quéré, Systematic Study of Traps in AlN/GaN/AlGaN HEMTs on SiC Substrate by Numerical TCAD Simulation. 12th IEEE Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (IEEE Press, Lisbon, 2016), pp. 1–4
ATLAS User’s Manual, Device Simulation Software (SILVACO International, Santa Clara, CA, 2010)
O. Ambacher, B. Foutz, J. Smart, J. Shealy, N. Weimann, K. Chu, M. Murphy, A. Sierakowski, W. Schaff, L. Eastman, R. Dimitrov, A. Mitchell, M. Stutzmann, Two-dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures. J. Appl. Phy. 87(1), 334–344 (1999)
M. Farahmand, C. Garetto, E. Belloti, K.F. Brennan, M. Goano, E. Ghillino, G. Ghione, J.D. Albrecht, P.P. Ruden, Monte Carlo simulation of electron transport in the III—nitride wurtzite phase materials system: Binaries and Ternaries. IEEE Trans. Elec. Dev. 48(3), 535–542 (2001)
J. Anwar, G. Kompa, A new small-signal modeling approach applied to GaN devices. IEEE Trans. Microw. Theory Tech. 53(11), 3440–3448 (2005)
W. Lu, V. Kumar, R. Schwindt, E. Piner, I. Adesida, DC, RF and microwave noise performance of AlGaN/GaN HEMTs on sapphire substrates. IEEE Trans. Microw. Theory Tech. 50(11), 2499–2504 (2002)
Z. Liu, G.-I. Ng, S. Arulkumaran, Study on the temperature dependence of the microwave-noise characteristics in AlGaN/GaN HEMTs. IEEE Trans. Elec. Dev. 57(9), 2353–2357 (2010)
Acknowledgements
Authors thank Defence Research and Development Organization, Govt. of India for financial support (CC/TM/ERIPR/GIA/16-17/008). Madhulika acknowledges the financial assistance of University Grants Commission (UGC), Government of India.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2019 Springer Nature Switzerland AG
About this paper
Cite this paper
Madhulika et al. (2019). Modelling DC, RF and Noise Behavior of AlGaN/GaN HEMT on SiC Substrate. In: Sharma, R., Rawal, D. (eds) The Physics of Semiconductor Devices. IWPSD 2017. Springer Proceedings in Physics, vol 215. Springer, Cham. https://doi.org/10.1007/978-3-319-97604-4_25
Download citation
DOI: https://doi.org/10.1007/978-3-319-97604-4_25
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-97603-7
Online ISBN: 978-3-319-97604-4
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)