Skip to main content

Abstract

Digital image correlation (DIC) is a powerful experimental technique to compute full-field displacements and strains. The basic idea of the method is to compare images of an object decorated with a speckle pattern before and after deformation, and thereby to compute displacements and strains. Since DIC is a non-contact method that gives the whole field deformation, it is widely used to measure complex deformation patterns. Finite element (FE)-based Global DIC with regularization is one of the commonly used algorithms and it can be combined with finite element numerical simulations at the same time (Besnard et al., J Strain Anal Eng Design 47(4):214–228, 2012). However, Global DIC algorithm is usually computationally expensive and converges slowly. Further, it is difficult to directly apply an adaptive finite element mesh to Global DIC because the stiffness matrix and the external force vector have to be rebuilt every time the mesh is changed.

In this paper, we report a new Global DIC algorithm that uses adaptive mesh. It builds on our recent work on the augmented Lagrangian digital image correlation (ALDIC) (Yang and Bhattacharya, Exp Mech, submitted). We consider the global compatibility condition as a constraint and formulate it using an augmented Lagrangian (AL) method. We solve the resulting problem using the alternating direction method of multipliers (ADMM) (Boyd et al., Mach Learn 3(1):1–122, 2010) where we separate the problem into two subproblems. The first subproblem is computed fast, locally and in parallel, and the second subproblem is computed globally without image grayscale value terms where nine point Gaussian quadrature works very well. Compared with current Global DIC algorithm, this new adaptive Global DIC algorithm decreases computation time significantly with no loss (and some gain) in accuracy.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Sutton, M.A., et al.: Image Correlation for Shape, Motion and Deformation Measurements: Basic Concepts, Theory and Applications (2009)

    Google Scholar 

  2. Pan, B., Qian, K., Xie, H., et al.: Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review. Meas. Sci. Technol. 20(6), 062001 (2009)

    Article  Google Scholar 

  3. Besnard, G., Leclerc, H., Hild, F., et al.: Analysis of image series through global digital image correlation. J. Strain Anal. Eng. Design. 47(4), 214–228 (2012)

    Article  Google Scholar 

  4. Nochetto, R.H., Siebert, K.G., Veeser, A.: Theory of adaptive finite element methods: an introduction. In: Multiscale, nonlinear and adaptive approximation, pp. 409–542. Springer, Berlin (2009)

    Chapter  Google Scholar 

  5. Yuan, Y., Huang, J., Fang, J., et al.: A self-adaptive sampling digital image correlation algorithm for accurate displacement measurement. Opt. Lasers Eng. 65, 57–63 (2015)

    Article  Google Scholar 

  6. Hild, F., Roux, S.: Digital image correlation. Wiley-VCH, Weinheim (2012)

    MATH  Google Scholar 

  7. Wittevrongel, L., et al.: A self adaptive global digital image correlation algorithm. Exp. Mech. 55(2), 361–378 (2015)

    Article  Google Scholar 

  8. Baker, S., et al.: Lucas-Kanade 20 years on: a unifying framework. Int. J. Comput. Vis. 56(3), 221–255 (2004)

    Article  MathSciNet  Google Scholar 

  9. Henn, S.: A Levenberg–Marquardt scheme for nonlinear image registration. BIT Numer. Math. 43(4), 743–759 (2003)

    Article  MathSciNet  Google Scholar 

  10. Boyd, S., Parikh, N., Chu, E., et al.: Distributed optimization and statistical learning via the alternating direction method of multipliers. Mach. Learn. 3(1), 1–122 (2010)

    Article  Google Scholar 

  11. Haber, E., Heldmann, S., Modersitzki, J.: Adaptive mesh refinement for nonparametric image registration. SIAM J. Sci. Comput. 30(6), 3012–3027 (2008)

    Article  MathSciNet  Google Scholar 

  12. Yang, J., Bhattacharya, K.: Augmented Lagrangian DIC. Submitted to Experimental Mechanics

    Google Scholar 

  13. Yang, J., Bhattacharya, K.: Fast Adaptive Global Digital Image Correlation. In preparation

    Google Scholar 

Download references

Acknowledgement

We gratefully acknowledge the support of the US Air Force Office of Scientific Research through the MURI grant ‘Managing the Mosaic of Microstructure’ (FA9550-12-1-0458).

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2019 The Society for Experimental Mechanics, Inc.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Yang, J., Bhattacharya, K. (2019). Fast Adaptive Global Digital Image Correlation. In: Lamberti, L., Lin, MT., Furlong, C., Sciammarella, C., Reu, P., Sutton, M. (eds) Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-97481-1_7

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-97481-1_7

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-97480-4

  • Online ISBN: 978-3-319-97481-1

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics