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Substrates and Coating Layers

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Spectroscopic Ellipsometry for Photovoltaics

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 214))

Abstract

The optical constants of various substrates and coating materials employed widely for solar-cell fabrication are summarized. The substrate materials described here include various SiO2 (soda-lime glass, borosilicate glass, fused silica, and quartz), metal (stainless) and plastic (polycarbonate, PEN, PET, PMMA, Kapton HN) substrates. For PEN, PET and Kapton HN substrates, which exhibit strong biaxial optical anisotropy , full data sets are provided. In solar cell devices, a protection coating (EVA) and anti-reflection (MgF2/LiF) layers are quite important, and the optical constants of these coating layers are also described here. The refractive index spectra of the transparent materials were parameterized using the Sellmeier model, whereas the parameterization of absorbing polymer substrates was carried out assuming several transition peaks calculated by the Tauc-Lorentz model. In this chapter, the model parameters for all the substrates and coating materials are summarized, together with the tabulated optical constants.

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Author information

Authors and Affiliations

  1. Gifu University, 1-1 Yanagido, Gifu, 501-1193, Japan

    Shohei Fujimoto, Takemasa Fujiseki & Hiroyuki Fujiwara

  2. J.A. Woollam Co., Inc., 645 M Street, Suite 102, Lincoln, NE, 68508, USA

    James N. Hilfiker & Nina Hong

  3. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, 08193, Bellaterra, Spain

    Mariano Campoy-Quiles

Authors
  1. Shohei Fujimoto
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  2. Takemasa Fujiseki
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  3. James N. Hilfiker
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  4. Nina Hong
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  5. Mariano Campoy-Quiles
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  6. Hiroyuki Fujiwara
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Corresponding author

Correspondence to Hiroyuki Fujiwara .

Editor information

Editors and Affiliations

  1. Department of Electrical, Electronic and Computer Engineering, Gifu University, Gifu, Japan

    Hiroyuki Fujiwara

  2. Department of Physics and Astronomy, The University of Toledo, Toledo, OH, USA

    Robert W. Collins

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Fujimoto, S., Fujiseki, T., Hilfiker, J.N., Hong, N., Campoy-Quiles, M., Fujiwara, H. (2018). Substrates and Coating Layers. In: Fujiwara, H., Collins, R. (eds) Spectroscopic Ellipsometry for Photovoltaics. Springer Series in Optical Sciences, vol 214. Springer, Cham. https://doi.org/10.1007/978-3-319-95138-6_13

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