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Overview About Radiation–Matter Interaction Mechanisms and Mitigation Techniques

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Proceedings of the 3rd Brazilian Technology Symposium (BTSym 2017)

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Abstract

This work presents a general overview about the origin and manifestation of ionizing radiation-induced effects over CMOS technology-based semiconductor structures. From the characterization of radiation–matter interaction mechanisms and effects, this work summarizes the set of design strategies described in the literature for radiation hardened electronic implementation, considering system level, block level, and device level approaches. Additionally, a final case study is presented characterizing the Total Ionizing Dose TID tolerant operation of the Diamond MOSFET transistor as an innovative alternative of non-standard MOSFET’s layout for space applications.

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Author information

Authors and Affiliations

  1. Center of Information Technology Renato Archer (CTI), Campinas, Brazil

    R. N. S. Raphael, L. E. Seixas Jr., S. A. Bascopé & S. Finco

  2. University of Campinas (Unicamp), Campinas, Brazil

    Agord M. Pinto Jr. & L. T. Manera

  3. FEI University Center, São Bernardo do Campo, Brazil

    S. P. Gimenez

Authors
  1. R. N. S. Raphael
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  2. L. E. Seixas Jr.
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  3. Agord M. Pinto Jr.
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  4. S. A. Bascopé
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  5. L. T. Manera
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  6. S. Finco
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  7. S. P. Gimenez
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Corresponding author

Correspondence to R. N. S. Raphael .

Editor information

Editors and Affiliations

  1. Faculty of Electrical and Computer Engineering, University of Campinas, Campinas, São Paulo, Brazil

    Yuzo Iano

  2. Faculty of Technology, University of Campinas, Campinas, São Paulo, Brazil

    Rangel Arthur

  3. Divisão de Engenharia Eletrônica, Instituto Tecnológico de Aeronáutica (ITA), São José dos Campos, São Paulo, Brazil

    Osamu Saotome

  4. Universidade Federal Fluminense (UFF), Duque de Caxias, Rio de Janeiro, Brazil

    Vania Vieira Estrela

  5. Faculty of Electrical and Computer Engineering, University of Campinas, Campinas, São Paulo, Brazil

    Hermes José Loschi

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Raphael, R.N.S. et al. (2019). Overview About Radiation–Matter Interaction Mechanisms and Mitigation Techniques. In: Iano, Y., Arthur, R., Saotome, O., Vieira Estrela, V., Loschi, H. (eds) Proceedings of the 3rd Brazilian Technology Symposium. BTSym 2017. Springer, Cham. https://doi.org/10.1007/978-3-319-93112-8_23

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  • DOI: https://doi.org/10.1007/978-3-319-93112-8_23

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-93111-1

  • Online ISBN: 978-3-319-93112-8

  • eBook Packages: EngineeringEngineering (R0)

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