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Handbook of Materials Characterization pp 217–261Cite as

Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications

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Abstract

Like all other imaging techniques, scanning tunneling microscopy (STM) is an ingenious approach for obtaining images with sufficiently high resolution. On the other hand, STM is beneficial for the deposition of metal over a substrate by manipulation of single atoms/molecules. This technique is greatly helpful for the nanoscience domain, providing the facility to study the property of materials at the atomic scale. The present topic covers most of the important aspects of the operation of STM, starting from theoretical background to instrumentation. The use of STM for topographical and spectroscopic imaging is firmly discussed. The potential application of STM in the technological field, surface science, solid-state physics, biology, and organic chemistry is manifested with concrete evidence, with which we expect to provide a complete idea of STM characterization technique to the readers.

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Acknowledgments

Authors are thankful to the Department of Science and Technology, Government of India, for sanction of Fast Track Research Project for Young Scientists to Dr. Prashant K. Sharma (Ref. No.: SR/FTP/PS-157/2011) and Dr. Rashmi Madhuri (Ref. No.: SB/FT/CS-155/2012). Dr. Sharma (FRS/34/2012-2013/APH) and Dr. Madhuri (FRS/43/2013-2014/AC) are also thankful to the Indian Institute of Technology (Indian School of Mines), Dhanbad, for grant of Major Research Project under Faculty Research Scheme. We are also thankful to the Board of Research in Nuclear Sciences (BRNS), Department of Atomic Energy, Government of India, for major research project (Sanction No. 34/14/21/2014-BRNS/0295). Suryakanti and Trupti are also thankful to the Indian Institute of Technology (Indian School of Mines), Dhanbad, for Fellowship.

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  1. Functional Nanomaterials Research Laboratory, Department of Applied Physics, Indian Institute of Technology (Indian School of Mines), Dhanbad, Jharkhand, India

    Suryakanti Debata, Trupti R. Das & Prashant K. Sharma

  2. Department of Applied Chemistry, Indian Institute of Technology (Indian School of Mines), Dhanbad, Jharkhand, India

    Rashmi Madhuri

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  1. Suryakanti Debata
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  2. Trupti R. Das
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Correspondence to Prashant K. Sharma .

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  1. Department of Physics, Federal University of Maranhão, São Luis, Maranhão, Brazil

    Surender Kumar Sharma

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Debata, S., Das, T.R., Madhuri, R., Sharma, P.K. (2018). Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications. In: Sharma, S. (eds) Handbook of Materials Characterization. Springer, Cham. https://doi.org/10.1007/978-3-319-92955-2_6

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