Abstract
X-ray absorption spectroscopy (XAS) with its two amendments, (i) X-ray absorption near-edge structure (XANES) and (ii) extended X-ray absorption fine structure (EXAFS), is a powerful technique for studying the electronic state of the solids where the important asset of the absorbing element can be ascertained using the excitation of core electrons with local and sensitive probe. The XANES is strongly sensitive to the formal oxidation state and coordination chemistry (i.e., tetrahedral or octahedral coordination) of absorbing atom, while the EXAFS is used to determine the distance, coordination number, and species of the neighbors of the absorbing atoms. This chapter describes the origin and interpretation of XANES-EXAFS spectra, with a hope of enhancing the ability of the reader to perform XANES-EXAFS measurements at beamline end stations or lab-source XAS machines. This chapter also contains brief discussion of XAS fundamental, XANES-EXAFS data collection in different modes, and data analysis/processing with modern ab initio calculations based on software packages and exclusively describes various applications of XANES-EXAFS on several oxide materials.
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Sharma, A., Singh, J.P., Won, S.O., Chae, K.H., Sharma, S.K., Kumar, S. (2018). Introduction to X-Ray Absorption Spectroscopy and Its Applications in Material Science. In: Sharma, S. (eds) Handbook of Materials Characterization. Springer, Cham. https://doi.org/10.1007/978-3-319-92955-2_13
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