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Multi-Run Tests Based on Background Changing

  • Ireneusz Mrozek
Chapter

Abstract

The chapter deals with multi-run tests based on background changing. First, dissimilarity measures for binary vectors are discussed. Then, the optimal (in terms of Pattern Sensitive Fault detection) algorithms with a restricted number of vectors are given. The algorithms are proposed for tests consisting of two, three, and four test vectors. All algorithms are deeply analyzed and their efficiency is analytically proven. Finally, the effective test pattern generation algorithm for tests with a number of test patterns greater than four is provided.

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Copyright information

© Springer International Publishing AG, part of Springer Nature 2019

Authors and Affiliations

  • Ireneusz Mrozek
    • 1
  1. 1.Bialystok University of TechnologyBialystokPoland

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