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Controlled Random Testing

  • Ireneusz Mrozek
Chapter

Abstract

The chapter covers controlled random tests (CRTs) that are extensively used for diagnosing complex digital circuits and systems. First, the basic definition and properties of CRTs are given. Then, the classical approach proposed by Malaiya is described. Finally, some extensions of classical antirandom testing are discussed.

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Copyright information

© Springer International Publishing AG, part of Springer Nature 2019

Authors and Affiliations

  • Ireneusz Mrozek
    • 1
  1. 1.Bialystok University of TechnologyBialystokPoland

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