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Radiation Experiments on CMOS PLLs

  • Jeffrey Prinzie
  • Michiel Steyaert
  • Paul Leroux
Chapter
  • 639 Downloads
Part of the Analog Circuits and Signal Processing book series (ACSP)

Abstract

In this chapter, the radiation experiments on the LC-oscillator and ring oscillator PLL are discussed. First, a discussion is made on the TID effects which are measured using X-rays. In total, two chips were irradiated to compare their results. Next, the single-event sensitivity of the circuits is discussed through measurements done with heavy ions and laser experiments. Finally, a brief discussion is done on the practical aspects of the setup.

Keywords

Ring Oscillator Single Event Sensitivity Varactor Free-running Oscillation Frequency Phase Jumps 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 146.
    J. G. Maneatis. Low-jitter process-independent DLL and PLL based on self-biased techniques. IEEE Journal of Solid-State Circuits, 31(11):1723–1732, Nov 1996.Google Scholar
  2. 150.
  3. 151.
    P. Andreani and S. Mattisson. On the use of MOS varactors in RF VCOs. IEEE Journal of Solid-State Circuits, 35(6):905–910, June 2000.Google Scholar
  4. 152.
    R. L. Bunch and S. Raman. Large-signal analysis of MOS varactors in CMOS -gm LC VCOs. IEEE Journal of Solid-State Circuits, 38(8):1325–1332, Aug 2003.Google Scholar
  5. 153.
    M. Menouni, M. Barbero, F. Bompard, S. Bonacini, D. Fougeron, R. Gaglione, A. Rozanov, P. Valerio, and A. Wang. 1-grad total dose evaluation of 65 nm CMOS technology for the HL-LHC upgrades. Journal of Instrumentation, 10(05):C05009, 2015.Google Scholar
  6. 154.
    Farshid Samii Amlashi, Adib Abrishamifar, and Reza Ebrahimi Atani. Jitter peaking investigation in charge pump based clock and data recovery circuits. In AFRICON 2007, pages 1–6, Sept 2007.Google Scholar
  7. 155.
    D. McMorrow, W. T. Lotshaw, J. S. Melinger, S. Buchner, Y. Boulghassoul, L. W. Massengill, and R. L. Pease. Three-dimensional mapping of single-event effects using two photon absorption. IEEE Transactions on Nuclear Science, 50(6):2199–2207, Dec 2003.Google Scholar
  8. 156.
    M. Newton, B. Danger, H. Wang, L. Chen, D. M. Hiemstra, and V. Kirischian. Two photon absorption laser facility for single event effect testing. In 2016 IEEE Radiation Effects Data Workshop (REDW), pages 1–5, July 2016.Google Scholar
  9. 157.
    T. D. Loveless, B. D. Olson, B. L. Bhuva, W. T. Holman, C. C. Hafer, and L. W. Massengill. Analysis of single-event transients in integer-n frequency dividers and hardness assurance implications for phase-locked loops. IEEE Transactions on Nuclear Science, 56(6):3489–3498, Dec 2009.Google Scholar

Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  • Jeffrey Prinzie
    • 1
  • Michiel Steyaert
    • 2
  • Paul Leroux
    • 1
  1. 1.KU LeuvenGeelBelgium
  2. 2.KU LeuvenHeverleeBelgium

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