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Low-Cost Ultrapure Sine Wave Generation with Self-Calibration

  • Yuming Zhuang
  • Degang Chen
Chapter

Abstract

As data acquisition systems’ performance continues to increase, so does the need for a test and characterization solution that exceeds the currently available state-of-the-art instruments. This chapter presents a new method for generating ultrapure sine waves used in such applications. The pure sine wave is generated by readily available digital-to-analog converters (DACs) with distortions that may be thousand times worse than the required system’s purity. Readily available analog-to-digital converter (ADC) with similar purity as the DAC is utilized to measure the distortions generated by these DACs. An innovative algorithm is used to remove distortions present in the generated sine wave iteratively. Simulation results verify the proposed method by generating a − 140 dB ultrapure sine wave using two DACs and an ADC with −85 dB total harmonic distortion (THD). A test circuit board has been designed, and measurement results demonstrate the generated sine wave has a high purity capable of testing an ADC with −120 dB THD accurately.

References

  1. 1.
    Y. Zhuang, A. Unnithan, A. Joseph, S. Sudani, B. Magstadt, D. Chen, Low cost ultra-pure sine wave generation with self calibration, in Proceedings of International Test Conference, (2016), pp. 1–9Google Scholar
  2. 2.
    M. Burns, G.W. Roberts, An Introduction to Mixed-Signal IC Test and Measurement (Oxford University Press, New York, 2012)Google Scholar
  3. 3.
    W. Kester, Data Conversion Handbook (Analog Devices Inc., Norwood, 2004)Google Scholar
  4. 4.
    IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std.1241, (2010)Google Scholar
  5. 5.
    IEEE Standard for Digitizing Waveform Recorders, IEEE Std.1057, (2007)Google Scholar
  6. 6.
    D. Rabijns, W.V. Moer, G. Vandersteen, Spectrally pure excitation signals: Only a dream? IEEE Trans. Instrum. Meas. 53(5), 1433–1440 (2004)CrossRefGoogle Scholar
  7. 7.
    A. Maeda, A method to generate a very low distortion, high frequency sine waveform using an AWG, in Proceedings of IEEE International Test Conference, (2008), pp. 1–8Google Scholar
  8. 8.
    F. Abe, Y. Kobayashi, K. Sawada, K. Kato, O. Kobayashi, H. Kobayashi, Low-distortion signal generation for ADC testing, in Proceedings of IEEE International Test Conference, (2014), pp. 1–10Google Scholar
  9. 9.
    M. Elsayed, E. Sanchez-Sinencio, A low THD, low power, high output-swing time-mode-based tunable oscillator via digital harmonic-cancellation technique. IEEE J. Solid State Circuits 45(5), 1061–1071 (2010)CrossRefGoogle Scholar
  10. 10.
    B.K. Vasan, S. Sudani, D. Chen, R. Geiger, Low-distortion sine wave generation using a novel harmonic cancellation technique. IEEE Trans. Circuits Syst. I, Reg. Papers 60(5), 1122–1134 (2013)CrossRefGoogle Scholar
  11. 11.
    APx555 Audio Analyzer Installation Instructions and Specifications, Audio Precision, Inc, (2014)Google Scholar
  12. 12.
    Precision Data Converter Test Module for X-Series (DCTM), LTX-Credence Corporation, (2012)Google Scholar
  13. 13.
    S. Sudani, Accurate spectral test algorithms with relaxed instrumentation requirements, in Graduate Theses and Books, (Iowa State University, Ames, IA, USA, 2013)Google Scholar
  14. 14.
    S. Sudani, D. Chen, FIRE: A fundamental identification and replacement method for accurate spectral test without requiring coherency. IEEE Trans. Instrum. Meas. 62(11), 15–25 (2013)CrossRefGoogle Scholar
  15. 15.
    S. Sudani, M. Wu, D. Chen, A novel robust and accurate spectral testing method for non-coherent sampling, in Proceedings of IEEE International Test Conference, (2011), pp. 1–10Google Scholar
  16. 16.
    Y. Zhuang, D. Chen, Accurate spectral testing with non-coherent sampling for large distortion to noise ratios, in Proceedings IEEE 34th VLSI Test Symposium, (2016), pp. 1–6Google Scholar

Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  • Yuming Zhuang
    • 1
  • Degang Chen
    • 2
  1. 1.Qualcomm IncSan DiegoUSA
  2. 2.Iowa State UniversityAmesUSA

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