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Abstract

In this book, several methods for accurate, robust spectral testing with relaxed instrumentation requirements are presented. They focus on resolving one or several stringent test conditions simultaneously in the conventional spectral testing regulated by IEEE standards. It is shown these methods relaxed many stringent test conditions seen from conventional spectral testing. They can obtain accurate spectral performance of the device or signal under test compared with the conventional test with much lower test costs and faster test time.

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References

  1. R.M. Warner, Spectral Analysis of Time-Series Data (The Guilford Press, New York, 1998)

    Google Scholar 

  2. P. Stoica, Introduction to Spectral Analysis (Prentice Hall, Upper Saddle River, 1997)

    MATH  Google Scholar 

  3. J.M. Chalmers, P.R. Griffiths, Handbook of Vibrational Spectroscopy (Wiley, New York, 2002)

    Google Scholar 

  4. P. Stoica, R.L. Moses, Spectral Analysis of Signals (Prentice Hall, Upper Saddle River, 2005)

    Google Scholar 

  5. J.N. Rayner, An Introduction to Spectral Analysis (Pion, London, 1971)

    Google Scholar 

  6. M. Burns, G.W. Roberts, An Introduction to Mixed-Signal IC Test and Measurement (Oxford Univerisity Press, New York, 2012)

    Google Scholar 

  7. J. Doernberg, H.-S. Lee, D.A. Hodges, Full-speed testing of a/D converters. IEEE J. Solid State Circuits SC-19, 820–827 (1984)

    Article  Google Scholar 

  8. IEEE standard for terminology and test methods for analg-to-digital converters. IEEE Std. 1241, (2010)

    Google Scholar 

  9. IEEE standard for terminology and test methods of digital-to-analog converter devices. IEEE Std. 1658, (2011)

    Google Scholar 

  10. IEEE standard for digitizing waveform recorders. IEEE Std. 1057, (2007)

    Google Scholar 

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Zhuang, Y., Chen, D. (2018). Introduction. In: Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements. Springer, Cham. https://doi.org/10.1007/978-3-319-77718-4_1

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  • DOI: https://doi.org/10.1007/978-3-319-77718-4_1

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-77717-7

  • Online ISBN: 978-3-319-77718-4

  • eBook Packages: EngineeringEngineering (R0)

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