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Circuit Biasing Using Fixator-Norator Pairs—A Tutorial

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Pathological Elements in Analog Circuit Design

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 479))

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Abstract

A procedure based on local biasing is presented in this chapter. This procedure initiates from port nullification and extends to nonlinear device nullification. It is shown that when a device internally powered but is nullified through its ports it is locally biased. A device can be locally biasing with full supplies, or with reduced number of supplies, and the differences are discussed. The main advantage of local biasing of a device is separating it from the rest of the circuit and bias it individually based on its requirements. Disadvantages of local biasing, however, is its practicality, requiring numerous supply sources and in disarrays. The solution presented here is biasing through the use of fixator-norator pairs (FNPs). By using FNP we are able to fix each transistor to its designated operating point, just like local biasing, while the power supplies remain in their normal location in the circuit (global biasing). Properties on fixators and norators are discussed and component modeling using FNPs are introduced. These models are of two types, linear and nonlinear. The effort in this chapter has been on making it a tutorial on the subject, and this has been done through several examples. The examples start from simple circuits and move into more elaborate integrated circuits.

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Notes

  1. 1.

    This is similar to nullor pair except a fixator-norator pair can accept sources.

  2. 2.

    For details please refer to Chap. 10 in [3].

  3. 3.

    The resistance Rf is in the bias loop and part of a required AC filter.

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Correspondence to Reza Hashemian .

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Hashemian, R. (2018). Circuit Biasing Using Fixator-Norator Pairs—A Tutorial. In: Fakhfakh, M., Pierzchala, M. (eds) Pathological Elements in Analog Circuit Design. Lecture Notes in Electrical Engineering, vol 479. Springer, Cham. https://doi.org/10.1007/978-3-319-75157-3_8

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  • DOI: https://doi.org/10.1007/978-3-319-75157-3_8

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