Abstract
The present work proposes a Test Plan to evaluate the performance of low-cost MEMS accelerometers, currently some of these sensors suffer from non-linearities in its outputs caused primarily by scale factors, biases and random noise, some of these factors can be compensated to a certain extent. The Test Plan is divided on three stages of testing, with each one testing different aspects of the sensor; and for those devices that are found suitable, a characterization of a basic accelerometer model is recommended to help increase their performance so that they may be able to be used in high demanding applications, such as Inertial Navigation Systems. It is important to acknowledge that this Test Plan does not ensure that every sensor will be able to be compensated, and should be primarily used for finding suitable sensors.
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We would like to thank the MyDCI program of UABC, our friends, colleges and instructors; and for the financial support provided by our sponsor CONACYT, with the contract grant number: 383573.
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García López, J.A., Aguilar, L. (2018). Design of a Low-Cost Test Plan for Low-Cost MEMS Accelerometers. In: Sanchez, M., Aguilar, L., Castañón-Puga, M., Rodríguez-Díaz, A. (eds) Computer Science and Engineering—Theory and Applications. Studies in Systems, Decision and Control, vol 143. Springer, Cham. https://doi.org/10.1007/978-3-319-74060-7_11
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