Abstract
We develop imaging (stigmatic) XUV spectrometers with the use of plane grazing-incidence varied line-space (VLS) diffraction gratings and focusing normal-incidence multilayer mirrors (MMs), including broadband aperiodic ones. A stigmatic 12–30 nm spectrometer with a resolving power of at least 500 is demonstrated.
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References
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Acknowledgements
This work was supported by the Russian Science Foundation (Grant No. 14-12-00506).
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Kolesnikov, A.O. et al. (2018). Broadband High-Resolution Imaging Spectrometers for the Soft X-Ray Range. In: Kawachi, T., Bulanov, S., Daido, H., Kato, Y. (eds) X-Ray Lasers 2016. ICXRL 2016. Springer Proceedings in Physics, vol 202. Springer, Cham. https://doi.org/10.1007/978-3-319-73025-7_58
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DOI: https://doi.org/10.1007/978-3-319-73025-7_58
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