Abstract
For the purpose of monitoring the beam intensity of laser-driven plasma soft X-ray laser (XRL), a Mo/Si multilayer reflector was coated on an X-ray photodiode detector. With synchrotron radiation at a wavelength of 13.9 nm, the s-polarized reflectance of the multilayer-coated photodiode , MP, was measured to be 52.5% at an angle of incidence of 45°, and the transmittance was 8.96%, which is defined as the ratio of the photodiode current measured at 45° to that at normal incidence. Moreover, the correlation coefficient between the reflectance and transmittance measured with XRL was 0.965. These results indicate that the MP serves as an excellent beam intensity monitor as well as provides an intense beam for XRL applications.
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Imazono, T. (2018). Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity. In: Kawachi, T., Bulanov, S., Daido, H., Kato, Y. (eds) X-Ray Lasers 2016. ICXRL 2016. Springer Proceedings in Physics, vol 202. Springer, Cham. https://doi.org/10.1007/978-3-319-73025-7_46
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DOI: https://doi.org/10.1007/978-3-319-73025-7_46
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