Abstract
The airbag squib drivers operate with multiple supply voltage (MSV ) levels, viz. the LV, MV and HV rails. Our goal is to ensure that there is no inadvertent activation of the drivers that will lead to the activation of the HS_FET and LS_FET. In addition to this inadvertent activation, diagnostic circuits for measuring the squib resistance are required. In this chapter, a robust biasing scheme that prevents inadvertent activation of the powerFETs, high currents triggered by tri-stated circuits, too high output voltage on the output buffer with a voltage and current selector biasing scheme is presented. In addition to the biasing scheme, the design of a bidirectional fault-tolerant current limited voltage source (CLVS ) that is mandatory for the squib resistance measurement is presented. Bidirectional fault-tolerant CLVS indicates both short to battery and short to ground and can be present simultaneously.
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References
M.H. Kim, Level shifter having single voltage source, U.S. Patent US7,683,667B2, 23 Mar 2010
C.Y. Chen, System and method for breakdown protection in start-up sequence with multiple power domains, U.S. Patent 7391595B2, 24 June 2008
B. Sharma et al., Avoiding excessive cross-terminal voltages of low voltage transistors due to undesirable supply-sequencing in environments with higher supply voltages, U.S. Patent US7,176,749B2
Y. Date et al., Current driver, U.S. Patent 7,466,166B2, Dec 2008
S.N. Easwaran, I. Hehemann, Bias current generator for multiple supply voltage circuit, U.S. Patent US7,888,993B2, 15 Feb 2011
S.N. Easwaran, S.V. Kashyap, R. Weigel, Voltage clamping circuit with ±100mV precision in high voltage OTA, Electronic Letters, 2pp, Online ISSN 1350-911X, published 12 Apr 2016
B. Razavi, Design of Analog CMOS Integrated Circuits (McGraw-Hill, New York, 2001)
S.N Easwaran, A Low Power NMOS LDO in the Philips C050PMU Process, Master Thesis, University of Twente, The Netherlands, May 2006
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Easwaran, S.N. (2018). Biasing Schemes and Diagnostics Circuit. In: Current Sensing Techniques and Biasing Methods for Smart Power Drivers. Springer, Cham. https://doi.org/10.1007/978-3-319-71982-5_6
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DOI: https://doi.org/10.1007/978-3-319-71982-5_6
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Online ISBN: 978-3-319-71982-5
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