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pn-Junctions

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Semiconductor Power Devices

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Notes

  1. 1.

    After multiplication with 2·dV/dx, Eq. (3.7) can be integrated analytically to obtain the field \( {\mathsf{E}}\left( {\text{x}} \right) \) as function of V(x) in both regions. From the continuity of potential and field at the metallurgical junction the potential parts V P , V N are then determined.

  2. 2.

    The threshold voltage given in data sheets for power diodes is about 0.2–0.5 V higher. Because these diodes have a pin structure (see Sect. 5), a voltage drop across the base (i) region and at the i-n junction have to be added. As threshold voltage one uses there the onset voltage V s in the simplified ohmic characteristic V F  = V s  + R · diff I F .

  3. 3.

    Some manufacturers data sheets specify V B at 25 °C, and for application at lower temperatures one must be aware of said decrease of V B with temperature.

References

  1. Bartsch, W., Schoerner, R., Dohnke, K.O.: Optimization of bipolar SiC-diodes by analysis of avalanche breakdown performance. In: Proceedings of the ICSCRM 2009, paper Mo-P-56 (2009)

    Google Scholar 

  2. Burtscher, J., Dannhäuser, F., Krasse, J.: Die Rekombination in Thyristoren und Gleichrichtern aus Silizium: Ihr Einfluß auf die Durchlaßkennlinie und das Freiwerdezeitverhalten. Solid St. Electron. 18, 35–63 (1975)

    Article  Google Scholar 

  3. Cooper, R.N.: An investigation of recombination in gold-doped pin rectifiers. Solid St. Electron. 26, 217–226 (1983)

    Article  Google Scholar 

  4. Davydov, B.: The rectifying action of semiconductors. Techn. Phys. UdSSR 5, 87–95 (1938)

    Google Scholar 

  5. Fulop, W.: Calculation of avalanche breakdown voltages of silicon pn-junctions. Solid State Electron. 10, 39–43 (1967)

    Article  Google Scholar 

  6. Lanyon, H.P.D., Tuft, R.A.: Bandgap narrowing in moderately to heavily doped silicon. IEEE Trans. Electron. Devices ED-26(7), 1014–1018 (1979)

    Google Scholar 

  7. Miller, S.L.: Ionization rates for holes and electrons in silicon. Phys. Rev. 105, 1246–1249 (1957)

    Article  Google Scholar 

  8. Moll, J.L.: Physics of Semiconductors. McGraw Hill, New York (1964)

    MATH  Google Scholar 

  9. Morgan, S.P., Smits, F.M.: Potential distribution and capacitance of a graded p-n junction. Bell Syst. Tech. J. 39, 1573–1602 (1960)

    Article  Google Scholar 

  10. Ogawa, T.: Avalanche breakdown and multiplication in silicon pin junctions. Japan. J. Appl. Phys. 4, 473–484 (1965)

    Article  Google Scholar 

  11. Rupp, R., Gerlach, R., Kabakow, A., Schörner, R., Hecht, C., Elpelt, R., Draghici, M.: Avalanche behaviour and its temperature dependence of commercial SiC MPS diodes: Influence of design and voltage class. In: Proceedings of the 26th ISPSD, pp 67–70 (2014)

    Google Scholar 

  12. Schottky, W.: Halbleitertheorie der Sperrschicht. Naturwissenschaften 26, 843 (1938)

    Article  MATH  Google Scholar 

  13. Schottky, W.: Zur Halbleitertheorie der Sperrschicht- und Spitzengleichrichter. Zeitschrift für Physik 113, 376–414 (1939)

    Article  MATH  Google Scholar 

  14. Schlangenotto, H., Gerlach, W.: On the effective carrier lifetime in psn-rectifiers at high injection levels. Solid St. Electron. 12, 267–275 (1969)

    Article  Google Scholar 

  15. Schlangenotto, H., Maeder, H.: Spatial composition and injection dependence of recombination in silicon power device structures. IEEE Trans. Electron. Dev. Ed-26(3), 191–200 (1979)

    Google Scholar 

  16. Shields, J.: Breakdown in silicon pn-junctions. Journ. Electron. Control 6, 132–148 (1959)

    Article  Google Scholar 

  17. Shockley, W.: The theory of p-n junctions in semiconductors and p-n junction transistors. Bell Syst. Techn. J. 28, 435–489 (1949)

    Article  Google Scholar 

  18. Shockley, W.: “The Theory of pn Junctions in Semiconductors”, in Electrons and Holes in Semiconductors. D. van Nostrand Company Inc, Princeton (1950)

    MATH  Google Scholar 

  19. Slotboom, J.W., De Graaff, H.C.: Measurements of bandgap narrowing in Si bipolar transistors. Solid St. Electron. 19, 857–862 (1976)

    Article  Google Scholar 

  20. Sze, S.M.: Semiconductor Devices, Physics and Technology, 2nd edn. Wiley, New York (2002)

    Google Scholar 

  21. Wagner, C.: Zur Theorie der Gleichrichterwirkung. Physikaliche Zeitschrift 32, 641–645 (1931)

    Google Scholar 

  22. Wul, B.M., Shotov, A.P.: Multiplication of electrons and holes in p-n junctions. Solid State Phys. Electron. Telecommun. 1, 491–497 (1960)

    Google Scholar 

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Lutz, J., Schlangenotto, H., Scheuermann, U., De Doncker, R. (2018). pn-Junctions. In: Semiconductor Power Devices. Springer, Cham. https://doi.org/10.1007/978-3-319-70917-8_3

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  • DOI: https://doi.org/10.1007/978-3-319-70917-8_3

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