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Advanced Electron Microscopy for Complex Nanotechnology

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Book cover The Nanoscale Optical Properties of Complex Nanostructures

Part of the book series: Springer Theses ((Springer Theses))

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Abstract

From this point forward, the focus of this thesis will be on electron microscopy. In this chapter, I examine complex nanostructures with applications in nanotechnology that are highly dependent on morphological, structural, compositional, and optical effects. The electron microscope is the ideal tool for this kind of analysis, and I show here a wide range of different STEM techniques that can be used to characterize complex nanotechnology with nanoscale precision.

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Authors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, USA

    Jordan A. Hachtel

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  1. Jordan A. Hachtel
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Hachtel, J.A. (2018). Advanced Electron Microscopy for Complex Nanotechnology. In: The Nanoscale Optical Properties of Complex Nanostructures. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-70259-9_4

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