Abstract
In this section we describe the work performed to characterise the level of electrostatic interaction the substrate has with the probe and the graphene or other 2D-material sample. To do this a method of dynamic contact electrostatic force microscopy (DC-EFM) was used.
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Kay, N.D. (2018). Nanoelectromechanical Phenomena. In: Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-70181-3_6
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DOI: https://doi.org/10.1007/978-3-319-70181-3_6
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