Testability Design

  • Selahattin Sayil


Testability design or design for testability (DFT) implies adding circuits within a test object to make it easier to test. With advances in VLSI, it is basically the increasing inaccessibility of the internal circuits that makes testing more and more difficult and causes testing costs to be an ever-growing portion of a product’s total costs. DFT techniques are valuable methods for helping solve the growing test problem. The cost is the increased silicon circuit area to accommodate the hardware overhead and potentially reduced circuit performance.


Testability design DFT design Design for testability Scan design Pseudo-random pattern test Ad hoc methods Built-in self-test 


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Copyright information

© Springer International Publishing AG 2018

Authors and Affiliations

  • Selahattin Sayil
    • 1
  1. 1.Lamar UniversityBeaumontUSA

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