Abstract
With shrinking sizes of devices and increasing chip densities, circuits have become so fast, compact, and inaccessible that the use of conventional methods based on mechanical probe has become limited and inadequate. The conventional test methods or the mechanical probe techniques used for functional and internal fault testing face increasingly difficult challenges. This chapter discusses these limitations of conventional methods and highlights the importance of alternative probing solutions to address the upcoming challenges.
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Sayil, S. (2018). Conventional Test Methods. In: Contactless VLSI Measurement and Testing Techniques. Springer, Cham. https://doi.org/10.1007/978-3-319-69673-7_1
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DOI: https://doi.org/10.1007/978-3-319-69673-7_1
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Online ISBN: 978-3-319-69673-7
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