Abstract
In Sect. 2.2, I introduced a method for extracting lateral work function differences across the surface of layered two-dimensional heterostructures The analysis techniques developed in Sect. 2.2 are applied to reflectivity of CVD-grown WSe2 crystals formed on epitaxial graphene in Chap. 4, and the resulting work function differences are used to determine the change in band alignment of the WSe2 and graphene layers due to charge transfer in the following sections. In this chapter, I address the utility of low-energy electron potentiometry, that is, using LEER to extract work function differences and hence the variation in electrostatic potential on surfaces, to examine 2D materials from a materials characterization standpoint.
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de la Barrera, S.C. (2017). Application of Work Function Extraction Method to Material Characterization. In: Layered Two-Dimensional Heterostructures and Their Tunneling Characteristics. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-69257-9_5
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