Abstract
In this chapter, the techniques that have been employed for the following experimental chapters will be discussed. The methodologies used to fabricate the resonant tunneling diodes (RTDs) studied in Chap. 4 are discussed before describing the details of the electronic probe station measurements that were used to characterise them. The Langmuir-Blodgett technique used to fabricate 2D and OD thin films is then described in detail. Finally, the characterisation techniques used throughout the work are described.
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Roberts, J. (2017). Sample Preparation and Experimental Techniques. In: Using Imperfect Semiconductor Systems for Unique Identification. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-67891-7_3
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DOI: https://doi.org/10.1007/978-3-319-67891-7_3
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