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Advances in Reliability Testing and Standards Development for LED Packages and Systems

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Solid State Lighting Reliability Part 2

Part of the book series: Solid State Lighting Technology and Application Series ((SSLTA,volume 3))

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Abstract

Currently available reliability test standards (and specifications) for LED packages and systems have mainly been focused on the evaluation of lumen maintenance lifetimes. A brief review on these published standards is given in Sect. 4.1. Then some advanced methods for LED lumen maintenance lifetime estimation by taking into the statistical effects into account are discussed in Sect. 4.2. Afterward Sects. 4.3 and 4.4 in which part of the materials are excerpted from reference (Qian et al., Reliab. Eng. Syst. Saf. 147:84–92, 2016; Qian et al., Prediction of Lumen Depreciation and Color Shift for Phosphor-converted White Light-Emitting Diodes Based on a Spectral Power Distribution Analysis Method, IEEE Access, to Be Published, (n.d.)) present two of the hot topics in the reliability field. In Sect. 4.3, a temperature-driven accelerated test method within 2000 h is proposed instead of the 6000 h test methods to qualify the LED luminaires and lamps with an expected lumen maintenance lifetime of 25,000 h. And in Sect. 4.4, a spectral power distribution (SPD) analysis-based method is proposed to simultaneously predict the lumen depreciation and color shift of phosphor-converted white LEDs (pc-LEDs). In the end, concluding remarks of this chapter are summarized in Sect. 4.5.

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Acknowledgment

The authors would also like to acknowledge the support of the National High-Tech Research and Development Program of China (863 Program, Grant No. 2015AA03A101) and China Postdoctoral Science Foundation (Grant No. 2015M570133).

Author information

Authors and Affiliations

  1. State Key Laboratory of Solid State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China

    C. Qian & Guo Qi Zhang

  2. State Key Laboratory of Solid State Lighting (Changzhou Base), Changzhou, China

    C. Qian, J. J. Fan, Xuejun Fan & Guo Qi Zhang

  3. College of Mechanical and Electrical Engineering, Hohai University, Changzhou, China

    J. J. Fan

  4. Department of Mechanical Engineering, Lamar University, Beaumont, USA

    Xuejun Fan

  5. EEMCS Faculty, Delft University of Technology, Delft, The Netherlands

    Guo Qi Zhang

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  1. C. Qian
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Correspondence to C. Qian .

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Editors and Affiliations

  1. Philips Lighting ‘s-Hertogenbosch, Hertogenbosch, Noord-Brabant, The Netherlands

    Willem Dirk van Driel

  2. Lamar University, Beaumont, Texas, USA

    Xuejun Fan

  3. EEMCS Faculty, Delft University of Technology, Delft, Zuid-Holland, The Netherlands

    Guo Qi Zhang

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Qian, C., Fan, J.J., Fan, X., Zhang, G.Q. (2018). Advances in Reliability Testing and Standards Development for LED Packages and Systems. In: van Driel, W., Fan, X., Zhang, G. (eds) Solid State Lighting Reliability Part 2. Solid State Lighting Technology and Application Series, vol 3. Springer, Cham. https://doi.org/10.1007/978-3-319-58175-0_4

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  • DOI: https://doi.org/10.1007/978-3-319-58175-0_4

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