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Solid State Lighting Reliability Part 2 pp 433–454Cite as

Assessing the Reliability of Electrical Drivers Used in LED-Based Lighting Devices

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Part of the book series: Solid State Lighting Technology and Application Series ((SSLTA,volume 3))

Abstract

Electrical components used in LED lighting devices have a significant impact on the reliability of lighting systems. Understanding the reliability of LED drivers requires a knowledge of the intended use of the device including environmental (e.g., temperature, humidity), electrical (i.e., voltage quality and transients), and mechanical (i.e., vibration) stresses that the products would experience. In addition, knowledge of the susceptibility of key electronic components (e.g., capacitors, switching transistors, diodes, ICs, and linear components) to these stresses is also important in understanding overall product reliability. Although this information is difficult to determine for an electronic assembly such as the LED lighting driver, accelerated tests can help provide insights regarding likely failure modes and provide a basis to project reliability and product lifetime. In this chapter we have investigated common failure modes in LED drivers under accelerated testing conditions.

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Acknowledgments

This material is based on work supported by the US Department of Energy under Award Number DE-EE0005124.

Disclaimer

This report was prepared as an account of work sponsored by an agency of the US Government. Neither the US Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the US Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the US Government or any agency thereof.

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Authors and Affiliations

  1. RTI International, 3040 Cornwallis Road, PO Box 12194, Research Triangle Park, NC, 27709-2194, USA

    J. Lynn Davis, Karmann Mills, Robert Yaga, Cortina Johnson & Joe Young

Authors
  1. J. Lynn Davis
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  2. Karmann Mills
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  3. Robert Yaga
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  4. Cortina Johnson
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  5. Joe Young
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Corresponding author

Correspondence to J. Lynn Davis .

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Editors and Affiliations

  1. Philips Lighting ‘s-Hertogenbosch, Hertogenbosch, Noord-Brabant, The Netherlands

    Willem Dirk van Driel

  2. Lamar University, Beaumont, Texas, USA

    Xuejun Fan

  3. EEMCS Faculty, Delft University of Technology, Delft, Zuid-Holland, The Netherlands

    Guo Qi Zhang

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Lynn Davis, J., Mills, K., Yaga, R., Johnson, C., Young, J. (2018). Assessing the Reliability of Electrical Drivers Used in LED-Based Lighting Devices. In: van Driel, W., Fan, X., Zhang, G. (eds) Solid State Lighting Reliability Part 2. Solid State Lighting Technology and Application Series, vol 3. Springer, Cham. https://doi.org/10.1007/978-3-319-58175-0_15

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  • DOI: https://doi.org/10.1007/978-3-319-58175-0_15

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-58174-3

  • Online ISBN: 978-3-319-58175-0

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