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Sensors and Instrumentation, Volume 5 pp 29–46Cite as

Comparison of Nonlinear System Identification Methods for Free Decay Measurements with Application to MEMS Devices

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Abstract

A number of methods for non-linear system identification in the time and frequency domain have been developed in the past. These methods have been applied to many systems, ranging from micro-scale devices to macro-scale systems, sometimes with uncertain results. The aim of this paper is to assess the efficiency of a subset of methods and understand their range of usability. The methods considered in this study are the restoring force surface (RFS), Hilbert transform (HT), zero-crossing (ZC), direct quadrature (DQ), short-time Fourier transform (SFT) and zero-crossing for asymmetric systems (ZCA). The accuracy and robustness of the methods against measured noise were evaluated using simulated data from a SDOF system. The application of the selected methods to a simulated non-linear MDOF system was also investigated. It could be shown that under certain conditions these methods may still provide reliable results for MDOF systems although generally their use should be avoided. The methods were also applied to data from a micro-electro-mechanical-systems (MEMS). Unfortunately, due to lack of symmetry in the experimental data, only the RFS and ZCA could have been used, leading to the finding that the MEMS device may be modelled using quadratic stiffness.

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Acknowledgements

Some of this work was funded by Sandia National Laboratories. Sandia National Laboratories is a multi-mission laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.

The collective of authors would also like to acknowledge Sandia Nonlinear Mechanics and Dynamics Research Institute (NOMAD) 2016 for providing funding, research facilities and networking opportunities which eventually led to this publication. Special thanks also belongs to Professor Thomas Kenny from Stanford university for providing the data from micro-electro-mechanical resonator.

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Authors and Affiliations

  1. Imperial College London, Exhibition Road, SW7 2AZ, London, UK

    Vaclav Ondra & Christoph W. Schwingshackl

  2. University of Stuttgart, Pfaffenwaldring 9, 70550, Stuttgart, Germany

    Robin Riethmueller

  3. Sandia National Laboratories, 87185, Albuquerque, NM, USA

    Matthew R. W. Brake

  4. William Marsh Rice University, 77005, Houston, TX, USA

    Matthew R. W. Brake

  5. Michigan State University, 48823, East Lansing, MI, USA

    Pavel M. Polunin

  6. Florida Institute of Technology, 32901, Melbourne, FL, USA

    Steven W. Shaw

Authors
  1. Vaclav Ondra
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  2. Robin Riethmueller
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  3. Matthew R. W. Brake
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  4. Christoph W. Schwingshackl
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  5. Pavel M. Polunin
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  6. Steven W. Shaw
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Correspondence to Vaclav Ondra .

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Editors and Affiliations

  1. LearnSV.com, Hermosa Beach, California, USA

    Evro Wee Sit

  2. PCB Piezotronics, Inc., Depew, New York, USA

    Chad Walber

  3. Texas Christian University, Fort Worth, Texas, USA

    Patrick Walter

  4. Cummins (United States), St. Paul, Minnesota, USA

    Steve Seidlitz

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Ondra, V., Riethmueller, R., Brake, M.R.W., Schwingshackl, C.W., Polunin, P.M., Shaw, S.W. (2017). Comparison of Nonlinear System Identification Methods for Free Decay Measurements with Application to MEMS Devices. In: Wee Sit, E., Walber, C., Walter, P., Seidlitz, S. (eds) Sensors and Instrumentation, Volume 5. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-54987-3_5

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  • DOI: https://doi.org/10.1007/978-3-319-54987-3_5

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  • Online ISBN: 978-3-319-54987-3

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