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Built-In Self-Test

  • Ran WangEmail author
  • Krishnendu Chakrabarty
Chapter
  • 337 Downloads

Abstract

It is well-known that BIST offers several advantages over an ATE [1].

Keywords

Test Pattern Test Response Test Cost Fault Coverage Area Overhead 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing AG 2017

Authors and Affiliations

  1. 1.Nvidia (United States)SunnyvaleUSA
  2. 2.Department of ECEDuke UniversityDurhamUSA

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