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Manufacturing Solutions

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Book cover Dependable Multicore Architectures at Nanoscale

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Abstract

The continued scaling of CMOS transistors has been the enabler of faster, cheaper, and denser ICs and electronics. However, as the scaling is slowly coming to its end, many challenges emerge, including higher static power, high manufacturing cost, and more important, reduced reliability. The latter is mainly due to process or time-zero variation (i.e., process variations) or time-dependent variations (either related to temporal/aging variations such as SILC, BTI, HCD, or to environmental variations such as radiations). This chapter provides a broad overview of the latest techniques that are being used to mitigate these reliability challenges in the latest technology nodes. In the first part of this chapter, we present some of the techniques that are being used to manage process variation, including both static and dynamic techniques. These techniques span the entire range from improved layout rules to dynamic voltage scaling all the way to techniques implemented in application software. In the second part of this chapter, a review of these aging effects is presented including SILC, BTI, HCD, and self-heating effects, as well as the latest research on how they can be mitigated. In the final section, we investigate radiation-induced upsets and how they impact the latest technology nodes including FinFET and SOI technologies.

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Authors and Affiliations

  1. IROC Technologies, 2 Square Roger Genin, 38000, Grenoble, France

    Adrian Evans

  2. Delft University of Technology, Mekelweg 4, 2628CD, Delft, The Netherlands

    Said Hamdioui

  3. Imec, Kapeldreef 75, 3001, Leuven, Belgium

    Ben Kaczer

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  1. Adrian Evans
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  2. Said Hamdioui
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  3. Ben Kaczer
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Correspondence to Adrian Evans .

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  1. Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy

    Marco Ottavi

  2. Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Athens, Greece

    Dimitris Gizopoulos

  3. National Inter-University Consortium for Telecommunications (CNIT), Rome, Italy

    Salvatore Pontarelli

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Evans, A., Hamdioui, S., Kaczer, B. (2018). Manufacturing Solutions. In: Ottavi, M., Gizopoulos, D., Pontarelli, S. (eds) Dependable Multicore Architectures at Nanoscale. Springer, Cham. https://doi.org/10.1007/978-3-319-54422-9_4

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