Abstract
Microelectronic variability is a phenomenon at the intersection of microelectronic scaling, semiconductor manufacturing, and how electronic systems are designed and deployed. Using timing errors, as the most threatening manifestation of variability, we showed various levels of microelectronic circuit and system design where the effects of variability can be mitigated. Increasing leakage power is another challenge; variability has already had a major impact on the leakage power. Coordinated combined methods are central to an emerging outlook on variability tolerance as discussed below (Fig. 13.1).
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Rahimi, A., Benini, L., Gupta, R.K. (2017). Outlook. In: From Variability Tolerance to Approximate Computing in Parallel Integrated Architectures and Accelerators. Springer, Cham. https://doi.org/10.1007/978-3-319-53768-9_13
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DOI: https://doi.org/10.1007/978-3-319-53768-9_13
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-53767-2
Online ISBN: 978-3-319-53768-9
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