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International Conference on Current Trends in Theory and Practice of Informatics

SOFSEM 2017: SOFSEM 2017: Theory and Practice of Computer Science pp 453–463Cite as

On Featured Transition Systems

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 10139))

Abstract

Software Product Lines (SPLs) are families of similar software products built from a common set of features. As the number of products of an SPL is potentially exponential in the number of its features, analysing SPLs is harder than for single software. In this invited paper, we synthesise six years of efforts in alleviating SPL verification and testing issues. To this end, we introduced Featured Transition Systems (FTS) as a compact behavioural model for SPLs. Based on this formalism, we designed verification algorithms and tools allowing to check temporal properties on FTS, thereby assessing the correct behaviour of all the SPL products. We also used FTS to define test coverage and generation techniques for model-driven SPLs. We also successfully employed the formalism in order to foster mutation analysis. We conclude with future directions on the development of FTS for SPL analysis.

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Notes

  1. 1.

    Note that prototype tools exist for other results we developed.

References

  1. Al-Hajjaji, M., Thüm, T., Meinicke, J., Lochau, M., Saake, G.: Similarity-based prioritization in software product-line testing. In: SPLC, pp. 197–206. ACM (2014)

    Google Scholar 

  2. ALL4TEC - MaTeLo. http://all4tec.net/index.php/en/model-based-testing/20-markov-test-logic-matelo

  3. Beohar, H., Mousavi, M.: Input-output conformance testing based on featured transition systems. In: 29th Annual ACM Symposium on Applied Computing, pp. 1272–1278. ACM (2014)

    Google Scholar 

  4. Beohar, H., Varshosaz, M., Mousavi, M.R.: Basic behavioral models for software product lines: expressiveness and testing pre-orders. Sci. Comput. Program. 123, 42–60 (2016)

    Article  Google Scholar 

  5. Classen, A.: Modelling and model checking variability-intensive systems. Ph.D. thesis, University of Namur (FUNDP) (2011)

    Google Scholar 

  6. Classen, A., Boucher, Q., Heymans, P.: A text-based approach to feature modelling: syntax and semantics of TVL. SCP 76, 1130–1143 (2011)

    Google Scholar 

  7. Classen, A., Cordy, M., Heymans, P., Legay, A., Schobbens, P.-Y.: Model checking software product lines with SNIP. STTT 14(5), 589–612 (2012)

    Article  Google Scholar 

  8. Classen, A., Cordy, M., Schobbens, P.-Y., Heymans, P., Legay, A., Raskin, J.-F.: Featured transition systems: foundations for verifying variability-intensive systems and their application to LTL model checking. Trans. Softw. Eng. 39, 1069–1089 (2013)

    Article  Google Scholar 

  9. Classen, A., Heymans, P., Schobbens, P.-Y., Legay, A.: Symbolic model checking of software product lines. In: ICSE 2011, pp. 321–330. ACM (2011)

    Google Scholar 

  10. Classen, A., Heymans, P., Schobbens, P.-Y., Legay, A., Raskin, J.-F.: Model checking lots of systems: efficient verification of temporal properties in software product lines. In: ICSE 2010, pp. 335–344. ACM (2010)

    Google Scholar 

  11. Cordy, M.: Model checking for the masses. Ph.D. thesis, University of Namur (2014)

    Google Scholar 

  12. Cordy, M., Classen, A., Heymans, P., Schobbens, P.-Y., Legay, A.: Managing evolution in software product lines: a model-checking perspective. In: VaMoS 2012, pp. 183–191. ACM (2012)

    Google Scholar 

  13. Cordy, M., Classen, A., Perrouin, G., Heymans, P., Schobbens, P.-Y., Legay, A.: Simulation-based abstractions for software product-line model checking. In: ICSE 2012, pp. 672–682. IEEE (2012)

    Google Scholar 

  14. Cordy, M., Heymans, P., Legay, A., Schobbens, P.-Y., Dawagne, B., Leucker, M.: Counterexample guided abstraction refinement of product-line behavioural models. In: FSE 2014. ACM (2014)

    Google Scholar 

  15. Cordy, M., Heymans, P., Schobbens, P.-Y., Legay, A.: Behavioural modelling and verification of real-time software product lines. In: SPLC 2012. ACM (2012)

    Google Scholar 

  16. Cordy, M., Schobbens, P.-Y., Heymans, P., Legay, A.: Beyond boolean product-line model checking: dealing with feature attributes and multi-features. In: ICSE 2013, pp. 472–481. IEEE (2013)

    Google Scholar 

  17. Cordy, M., Schobbens, P.-Y., Heymans, P., Legay, A.: Provelines: a product-line of verifiers for software product lines. In: SPLC 2013, pp. 141–146. ACM (2013)

    Google Scholar 

  18. Devroey, X., Perrouin, G., Cordy, M., Papadakis, M., Legay, A., Schobbens, P.: A variability perspective of mutation analysis. In: SIGSOFT FSE, pp. 841–844. ACM (2014)

    Google Scholar 

  19. Devroey, X., Perrouin, G., Cordy, M., Samih, H., Legay, A., Schobbens, P.-Y., Heymans, P.: Statistical prioritization for software product line testing: an experience report. Software & Systems Modeling, pp. 1–19 (2015)

    Google Scholar 

  20. Devroey, X., Perrouin, G., Cordy, M., Schobbens, P., Legay, A., Heymans, P.: Towards statistical prioritization for software product lines testing. In: VaMoS, pp. 10:1–10:7. ACM (2014)

    Google Scholar 

  21. Devroey, X., Perrouin, G., Legay, A., Cordy, M., Schobbens, P.-Y., Heymans, P.: Coverage criteria for behavioural testing of software product lines. In: Margaria, T., Steffen, B. (eds.) ISoLA 2014. LNCS, vol. 8802, pp. 336–350. Springer, Heidelberg (2014). doi:10.1007/978-3-662-45234-9_24

    Google Scholar 

  22. Devroey, X., Perrouin, G., Legay, A., Schobbens, P., Heymans, P.: Covering SPL behaviour with sampled configurations: an initial assessment. In: VaMoS, p. 59. ACM (2015)

    Google Scholar 

  23. Devroey, X., Perrouin, G., Papadakis, M., Legay, A., Schobbens, P., Heymans, P.: Featured model-based mutation analysis. In: ICSE, pp. 655–666. ACM (2016)

    Google Scholar 

  24. Devroey, X., Perrouin, G., Schobbens, P., Heymans, P.: Poster: vibes, transition system mutation made easy. In: ICSE, vol. 2, pp. 817–818. IEEE Computer Society (2015)

    Google Scholar 

  25. Henard, C., Papadakis, M., Perrouin, G., Klein, J., Heymans, P., Traon, Y.L.: Bypassing the combinatorial explosion: using similarity to generate and prioritize t-wise test configurations for software product lines. IEEE Trans. Softw. Eng. 40(7), 650–670 (2014)

    Article  Google Scholar 

  26. Henard, C., Papadakis, M., Perrouin, G., Klein, J., Traon, Y.L.: Multi-objective test generation for software product lines. In: SPLC, pp. 62–71. ACM (2013)

    Google Scholar 

  27. Holzmann, G.J., Model, T.S.: Checker: Primer and Reference Manual. Addison-Wesley, New York (2004)

    Google Scholar 

  28. Jia, Y., Harman, M.: An analysis and survey of the development of mutation testing. IEEE TSE 37(5), 649–678 (2011)

    Google Scholar 

  29. Johansen, M.F., Haugen, Ø., Fleurey, F.: Properties of realistic feature models make combinatorial testing of product lines feasible. In: Whittle, J., Clark, T., Kühne, T. (eds.) MODELS 2011. LNCS, vol. 6981, pp. 638–652. Springer, Heidelberg (2011). doi:10.1007/978-3-642-24485-8_47

    Chapter  Google Scholar 

  30. Kang, K., Cohen, S., Hess, J., Novak, W., Peterson, S.: Feature-oriented domain analysis (FODA) feasibility study. Technical report CMU/SEI-90-TR-21 (1990)

    Google Scholar 

  31. Olaechea, R., Fahrenberg, U., Atlee, J.M., Legay, A.: Long-term average cost in featured transition systems. In: Proceedings of the 20th International Systems and Software Product Line Conference, SPLC 2016, pp. 109–118. ACM, New York, NY, USA (2016)

    Google Scholar 

  32. Perrouin, G., Sen, S., Klein, J., Baudry, B., Traon, Y.L.: Automated and scalable t-wise test case generation strategies for software product lines. In: ICST, pp. 459–468. IEEE Computer Society (2010)

    Google Scholar 

  33. Rodrigues, G.N., Alves, V., Nunes, V., Lanna, A., Cordy, M., Schobbens, P., Sharifloo, A.M., Legay, A.: Modeling and verification for probabilistic properties in software product lines. In: HASE, pp. 173–180. IEEE Computer Society (2015)

    Google Scholar 

  34. Rodrigues, G.N., Alves, V., Nunes, V., Lanna, A., Cordy, M., Schobbens, P.-Y., Sharifloo, A.M., Legay, A.: Modeling and verification for probabilistic properties in software product lines. In: Proceedings of the 16th International Symposium on High Assurance Systems Engineering (2015)

    Google Scholar 

  35. Samih, H., Bogusch, R.: MPLM - MaTeLo product line manager. In: Proceedings of the 18th International Software Product Line Conference: Companion Volume for Workshops, Demonstrations and Tools, SPLC 2014, vol. 2, pp. 138–142. ACM, New York, NY, USA (2014)

    Google Scholar 

  36. Schobbens, P.-Y., Heymans, P., Trigaux, J.-C., Bontemps, Y., Diagrams, F.: A survey and a formal semantics. In: RE 2006, pp. 139–148 (2006)

    Google Scholar 

  37. Vardi, M.Y., Wolper, P.: An automata-theoretic approach to automatic program verification. In: LICS 1986, pp. 332–344. IEEE CS (1986)

    Google Scholar 

  38. Whittaker, J., Thomason, G., Michael, A.: Markov chain model for statistical software testing. IEEE Trans. Softw. Eng. 20(10), 812–824 (1994)

    Article  Google Scholar 

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Author information

Authors and Affiliations

  1. INRIA Rennes Bretagne Atlantique, Rennes, France

    Axel Legay

  2. PReCISE Research Center, Faculty of Computer Science, University of Namur, Namur, Belgium

    Gilles Perrouin, Xavier Devroey, Maxime Cordy, Pierre-Yves Schobbens & Patrick Heymans

Authors
  1. Axel Legay
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  2. Gilles Perrouin
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  3. Xavier Devroey
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  4. Maxime Cordy
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  5. Pierre-Yves Schobbens
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  6. Patrick Heymans
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Corresponding author

Correspondence to Axel Legay .

Editor information

Editors and Affiliations

  1. TU Dortmund , Dortmund, Germany

    Bernhard Steffen

  2. TU Dresden , Dresden, Germany

    Christel Baier

  3. Eindhoven University of Technology , Eindhoven, The Netherlands

    Mark van den Brand

  4. Alpen Adria University Klagenfurt , Klagenfurt, Austria

    Johann Eder

  5. Lero - Irish Software Research Center , Limerick, Ireland

    Mike Hinchey

  6. Lero - Irish Software Research Center , Limerick, Ireland

    Tiziana Margaria

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Legay, A., Perrouin, G., Devroey, X., Cordy, M., Schobbens, PY., Heymans, P. (2017). On Featured Transition Systems. In: Steffen, B., Baier, C., van den Brand, M., Eder, J., Hinchey, M., Margaria, T. (eds) SOFSEM 2017: Theory and Practice of Computer Science. SOFSEM 2017. Lecture Notes in Computer Science(), vol 10139. Springer, Cham. https://doi.org/10.1007/978-3-319-51963-0_35

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  • DOI: https://doi.org/10.1007/978-3-319-51963-0_35

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  • Print ISBN: 978-3-319-51962-3

  • Online ISBN: 978-3-319-51963-0

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